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Technical Committee on Reliability (R) [schedule] [select]
Chair Mitsuhiro Kimura (Hosei Univ.)
Vice Chair Hiroyasu Mawatari (NTT)
Secretary Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.)
Assistant Maratt Zanikef (Kyushu Inst. of Tech.), Nobuyuki Tamura (Hosei Univ.)

Conference Date Thu, Nov 20, 2014 13:45 - 16:25
Conference Place  
Sponsors This conference is co-hosted by IEEE Reliability Society Japan Chapter and Reliability Engineering Association of Japan (Kansai Chapter).
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Thu, Nov 20 PM 
13:45 - 16:25
(1) 13:45-14:10 Prediction of performance degradation and lifetime for semiconductor devices using markov chain model R2014-61 Kai Momoda, Koichi Endo, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae (Osaka Univ.)
(2) 14:10-14:35 Reliability Analysis for Degradation Process Data Based on Bayesian Methods Toru Kaise (Univ. of Hyogo)
(3) 14:35-15:00 Reliability Analysis for Degradation Processes Based on Stochastic Differential Equations Toru Kaise (Univ. of Hyogo)
  15:00-15:10 Break ( 10 min. )
(4) 15:10-15:35 The study about acceleration model of ceramic capacitors by voltage stress R2014-62 Toshinari Matsuoka (MELCO)
(5) 15:35-16:00 Problem of Repeatability about Dew Test and Evaluation Method by Micro Dew Condensation Test R2014-63 Mayuko Nishihara, Kazuhiro Hayashinuma (Murata.Co)
(6) 16:00-16:25 A Study on Evaluation for fretting corrosion R2014-64 Sadanori Itou (itoken office)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Akira Asato (FUJITSU)
E--mail: a 

Last modified: 2014-09-21 22:12:51

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