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Technical Committee on Reliability (R) [schedule] [select]
Chair Hiroyasu Mawatari (NTT)
Vice Chair Tetsushi Yuge (National Defense Academy)
Secretary Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.)
Assistant Maratt Zanikef (Kyushu Inst. of Tech.), Nobuyuki Tamura (Hosei Univ.)

Conference Date Fri, Jun 19, 2015 13:30 - 15:15
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Conference Place  
Sponsors This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is technical co-sponsored by Reliability Engineering Association of Japan.
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

Fri, Jun 19 PM 
13:30 - 15:15
(1) 13:30-13:55 On a generalization of RBF networks by FGM copula R2015-10 Shuhei Ota, Mitsuhiro Kimura (Hosei Univ.)
(2) 13:55-14:20 A Note on Software Aging Estimation Using Hidden Markov Model R2015-11 Hiroyuki Okamura, Chao Luo, Tadashi Dohi (Hiroshima Univ.)
  14:20-14:25 Break ( 5 min. )
(3) 14:25-14:50 Software Reliability Assessment Based on Non-homogeneous Power Law Processes R2015-12 Yasuhiro Saito, Tadashi Dohi (Hiroshima Univ.)
(4) 14:50-15:15 A Study of Short-time Evaluation Method for Aluminum Electrolytic Capacitor R2015-13 Yuichi Sumimoto, Kazuya Murakami, Kenji Adachi (Toshiba)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Akira Asato (FUJITSU)
E--mail: a 


Last modified: 2015-04-17 09:42:42


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