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Technical Committee on Electron Device (ED) [schedule] [select]
Chair Takao Waho
Vice Chair Masaaki Kuzuhara
Secretary Tsuyoshi Tanaka, Manabu Arai
Assistant Shin-ichiro Takatani

Technical Committee on Reliability (R) [schedule] [select]
Chair Shuichi Fukuda
Vice Chair Shigeru Yanagi
Secretary Kazuaki Wakai, Tetsushi Yuge
Assistant Yoshiyuki Ihara, Yoshino Fukai

Conference Date Fri, Nov 25, 2005 10:10 - 16:20
Topics  
Conference Place Chuo-Denki-Kurabu 
Address 2-1-25, Doujimahama, Kita-ku, Osaka-shi, Japan
Transportation Guide 5 minutes walk from JR Osaka station, or 6 minutes walk from JR Kita-sinti station
http://www.chuodenki-club.or.jp/map/annai.html
Contact
Person
06-6345-6351
Sponsors This conference is co-sponsored by the Reliability Engineering Association of Japan and IEEE-RS Japan Chapter

Fri, Nov 25 AM 
10:10 - 11:30
(1) 10:10-10:50 [Invited Talk]
Reliability Evaluation in Low Temperature Poly-Si Thin Film Transistors
Yukiharu Uraoka, Takashi Fuyuki (NAIST)
(2) 10:50-11:30 [Invited Talk]
Barrier films prepared for organic electroluminescence device
Akira Heya (Univ. of Hyogo), Toshiharu Minami (IRII), Toshikazu Niki, Shigehira Minami (Ishikawa Seisakusyo), Atsushi Masuda, Hironobu Umemoto (JAIST), Naoto Matsuo (Univ. of Hyogo), Hideki Matsumura (JAIST)
Fri, Nov 25 PM 
13:10 - 16:20
(3) 13:10-13:35 Development of accurate NBTI lifetime prediction and evaluation methods using hole injection Akinobu Teramoto, Kazufumi Watanabe, Rihito Kuroda (Tohoku Univ.), Michihiko Mifuji, Takahisa Ymaha (Rohm), Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.)
(4) 13:35-14:00 -- Ryouhei Uno, Haruhiko Yoshida, Shinichi Sato (Univ. of Hyogo)
(5) 14:00-14:25 Localization Method of Failure Point with Scan Chain Takeshi Kataoka, Hisakazu Watanabe, Yasushi Kannan, Masaji Tanaka (Matsushita Electric Industrial)
(6) 14:25-14:50 Highly reliable InP-based HBTs with a ledge structure operating at current density over 2mA/um2 Yoshino K. Fukai, Kenji Kurishima, Minoru Ida, Shoji Yamahata, Takatomo Enoki (NTT Photonics Labs.)
  14:50-15:05 Break ( 15 min. )
(7) 15:05-15:30 -- Yoichi Nogami, Takayuki Hisaka, Naohito Yoshida (Mitsubishi)
(8) 15:30-15:55 Electrical characterization of n-GaN exposed to hydrogen plasma Masayuki Suda, Seiji Nakamura, Michihiko Suhara, Tsugunori Okumura (Tokyo Metropolitan Univ.)
(9) 15:55-16:20 Investigation of gate leakage current and gate control anomalies in nanometer-scale Schottky gate AlGaN/GaN HFETs Seiya Kasai, Junji Kotani, Hideki Hasegawa, Tamotsu Hashizume (Hokkaido Univ.)

Announcement for Speakers
General Talk (25)Each speech will have 20 minutes for presentation and 5 minutes for discussion.
Invited Talk (40)Each speech will have 35 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
ED Technical Committee on Electron Device (ED)   [Latest Schedule]
Contact Address Tsuyoshi Tanaka(Matsushita)
TEL: 075-956-9083, FAX: 075-956-9110
E--mail: pac
Manabu Arai(New JRC)
TEL: 049-278-1477、FAX: 049-278-1419
E--mail: injr
Shinichiro Takatani(Hitachi)
TEL: 049-278-1477、FAX: 049-278-1419
E--mail: injr 
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Kazuaki Wakai(NHK)
TEL0480-85-1118,FAX0480-85-1508
E--mail:ik-dm 


Last modified: 2005-09-26 20:21:18


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