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| Chair |
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Tatsuhiro Tsuchiya (Osaka Univ.) |
| Vice Chair |
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Toshinori Hosokawa (Nihon Univ.) |
| Secretary |
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Masayuki Arai (Nihon Univ.), Kazuteru Namba (Chiba Univ.) |
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| Conference Date |
Tue, Feb 28, 2023 11:00 - 17:05 |
| Topics |
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| Conference Place |
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Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Registration Fee |
This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on DC. |
Tue, Feb 28 AM
11:00 - 11:50 |
| (1) |
11:00-11:25 |
 DC2022-82 |
Takumi Sugioka, Yoshikazu Nagamura (Tokyo Metropolitan Univ.), Masayuki Arai (Nihon Univ.), Satoshi Fukumoto (Tokyo Metropolitan Univ.) |
| (2) |
11:25-11:50 |
A Test Generation Method to Distinguish Multiple Fault Pairs for Improvement of Fault Diagnosis Resolution DC2022-83 |
Yuya Chida, Toshinori Hosokawa (NIhon Univ.), Koji Yamazaki (Meiji Univ.) |
| |
11:50-13:00 |
Break ( 70 min. ) |
Tue, Feb 28 PM
13:00 - 14:15 |
| (3) |
13:00-13:25 |
DC2022-84 |
Taito Asaji, Tatsuhiro Tsuchiya (Osaka Univ.) |
| (4) |
13:25-13:50 |
A Clear and Understandable Notation for Expressing T-Way Test Sequence Generation Constraints DC2022-85 |
Lele Jiang, Tatsuhiro Tsuchiya (Osaka Univ.) |
| (5) |
13:50-14:15 |
Analysis of the Relationship between the Error Recovery and Reliability on Approximate Multipliers DC2022-86 |
Kozuma, Tamaki, Wang,Qilin, Ichihara, Hideyuki, Inoue, Tomoo (Hiroshima City Univ.) |
| |
14:15-14:25 |
Break ( 10 min. ) |
Tue, Feb 28 PM
14:25 - 15:40 |
| (6) |
14:25-14:50 |
Test Point Selection Method Using Graph Neural Networks and Deep Reinforcement Learning DC2022-87 |
Shaoqi Wei, Kohei Shiotani, Senling Wang, Hiroshi Kai, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) |
| (7) |
14:50-15:15 |
A Don't-Care Filling Method of Control Signals on Controllers for Two-Pattern Concurrent Testing DC2022-88 |
Xu Haofeng, Hosokawa Toshinori (Nihon Univ.), Yoshimura Masayoshi (KSU), Arai Masayuki (Nihon Univ.) |
| (8) |
15:15-15:40 |
A Seed Generation Method for Multiple Random Pattern Resistant Transition Faults for BIST DC2022-89 |
Yangling Xu, Rei Miura, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (KSU) |
| |
15:40-15:50 |
Break ( 10 min. ) |
Tue, Feb 28 PM
15:50 - 17:05 |
| (9) |
15:50-16:15 |
Stochastic flash ADC with variable input voltage range DC2022-90 |
Taira Sakaguchi, Satoshi Komatsu (Tokyo Denki Univ.) |
| (10) |
16:15-16:40 |
A Novel High Performance Scan-Test-Aware Hardened Latch with Improved Soft Error Tolerability DC2022-91 |
Ruijun Ma (AUST), Stefan Holst, Xiaoqing Wen (KIT), Hui Xu (AUST), Aibin Yan (AU) |
| (11) |
16:40-17:05 |
Effective Switching Probability Calculation to Locate Hotspots in Logic Circuit DC2022-92 |
Taiki Utsunomiya, Kohei Miyase, Ryu Hoshino (Kyutech), Shyue-Kung Lu (NTUST), Xiaoqing Wen, Seiji Kajihara (Kyutech) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| DC |
Technical Committee on Dependable Computing (DC) [Latest Schedule]
|
| Contact Address |
Masayuki Arai (College of Industrial Technology, Nihon Univ.)
E- : a i        n-u |
Last modified: 2023-01-06 15:00:19
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