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Technical Committee on Reliability (R) [schedule] [select]
Chair Tadashi Dohi (Hiroshima Univ.)
Vice Chair Yasushi Kadota (Ricoh)
Secretary Hiroyuki Okamura (Hiroshima Univ.), Shinji Inoue (Kansai Univ.)
Assistant Shinji Yokogawa (Univ. of Electro-Comm.), Takahide Yoshikawa (Fujitsu Lab.), Takenori Sakumura (Housei Univ.)

Conference Date Thu, Nov 17, 2022 14:00 - 16:15
Topics Reliability of semiconductor and electronic devices, Reliability general 
Conference Place  
Sponsors This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Registration Fee This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on R.

Thu, Nov 17 PM 
14:00 - 16:15
(1) 14:00-14:25 Edge Server Optimization Based on Stochastic Differential Equation Models R2022-40 Kohei Fujita (Yamaguchi Univ.), Yoshinobu Tamura (Yamaguchi univ.), Shigeru Yamada (Tottori univ.)
(2) 14:25-14:50 Optimal Maintenance Interval for DU Fault of Safety-Related System R2022-41 Shinji Inoue (Kansai Univ.), Shigeru Yamada (Tottori Univ.)
(3) 14:50-15:15 Dimensional stabilization by higher-order structure control of liquid crystal polymer in electronic parts R2022-42 Toyohiro Imaizumi, Osamu Otani (omron)
  15:15-15:25 Break ( 10 min. )
(4) 15:25-15:50 Process capability index for reliability evaluation R2022-43 Toshinari Mastsuoka (MELCO)
(5) 15:50-16:15 An Inference Method for Failure Detections Based on Hierarchical Bayesian Modeling and Filtering Toru Kaise (Univ. of Hyogo)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Shinji Inoue (Kansai Univ.)
E-: ini-u 


Last modified: 2022-09-15 16:20:46


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