|
|
| Chair |
|
Tadashi Dohi (Hiroshima Univ.) |
| Vice Chair |
|
Yasushi Kadota (Ricoh) |
| Secretary |
|
Hiroyuki Okamura (Hiroshima Univ.), Shinji Inoue (Kansai Univ.) |
| Assistant |
|
Shinji Yokogawa (Univ. of Electro-Comm.), Takahide Yoshikawa (Fujitsu Lab.), Takenori Sakumura (Housei Univ.) |
|
| Conference Date |
Thu, Nov 17, 2022 14:00 - 16:15 |
| Topics |
Reliability of semiconductor and electronic devices, Reliability general |
| Conference Place |
|
| Sponsors |
This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.
|
Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Registration Fee |
This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on R. |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| R |
Technical Committee on Reliability (R) [Latest Schedule]
|
| Contact Address |
Shinji Inoue (Kansai Univ.)
E- : i   n i-u |
Last modified: 2022-09-15 16:20:46
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