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Technical Committee on Reliability (R) [schedule] [select]
Chair Tetsushi Yuge (National Defense Academy)
Vice Chair Akira Asato (Fujitsu)
Secretary Nobuyuki Tamura (Hosei Univ.), Shigeto Hiraguri (RTRI)
Assistant Shinji Inoue (Kansai Univ.), Hiroyuki Okamura (Hiroshima Univ.)

Conference Date Thu, Nov 16, 2017 14:00 - 16:45
Conference Place  
Transportation Guide
Sponsors This conference is co-sponsored by Kansai Branch of Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

Thu, Nov 16 PM 
14:00 - 16:45
(1) 14:00-14:25 A Study for Accelerated Humidity Stress Test R2017-50 Sadanori Ito (Itoken)
(2) 14:25-14:50 The Electrochemical Migration Test Using Condensation Cycle Test R2017-51 Takaaki Semba, Katsuyuki Ishizu, Takafumi Fujisawa (MMC)
(3) 14:50-15:15 The study of Acceleration model Based on the Step Stress test R2017-52 Toshinari Matsuoka (Mitsubishi Electric)
  15:15-15:30 Break ( 15 min. )
(4) 15:30-15:55 Effects on Stresses in HALT R2017-53 Raphael Pihet, Takuya Hirata, Hideki Kawai, Aoki Yuichi (ESPEC)
(5) 15:55-16:20 Weak Points Detection of Products by Multiple Power Cycling Test R2017-54 katsuyuki Ishizu (MMC), Hiroaki Nishikawa (KMM)
(6) 16:20-16:45 Bayesian Reliability Analysis Based on Degradation Data R2017-55 Toru Kaise (Univ. of Hyogo)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Hiroyuki Okamura (Hiroshima Univ.)
E--mail: l-u 

Last modified: 2017-09-20 16:29:46

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