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Technical Committee on Reliability (R) [schedule] [select]
Chair Mitsuhiro Kimura (Hosei Univ.)
Vice Chair Hiroyasu Mawatari (NTT)
Secretary Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.)
Assistant Nobuyuki Tamura (Hosei Univ.), Maratt Zanikef (Kyushu Inst. of Tech.)

Conference Date Thu, Nov 14, 2013 14:00 - 16:30
Conference Place  
Sponsors This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is technical co-sponsored by Reliability Engineering Association of Japan.
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Thu, Nov 14 PM 
14:00 - 16:30
(1) 14:00-14:25 Newest non-destructive X-ray inspection technology of conducting research and development and failure analysis
-- It introduces from the foundation to application. --
Masahito Natsuhara (shimadzu)
(2) 14:25-14:50 Effective non-destructive defect localization by using Enhanced Lock-In Thermography R2013-75 Toshinobu Nagatomo (DCG Systems)
(3) 14:50-15:15 Effect of Plate-Shape Ni-Sn IMC on the Growth Mechanism of Tin Whisker under Thermal Shock Stress R2013-76 Akira Saito, Akira Okamoto, Yoshihiro Iwahori, Makoto Ogawa (Mutrata MFG), Akihiro Motoki (Sabae Mutrata MFG)
(4) 15:15-15:40 A Study on Sn-whisker growth by thermal cycle R2013-77 Sadanori Itou (Itoken office)
(5) 15:40-16:05 Bayesian Reliability Analysis for Software Debugging Processes Based on Remaining Errors R2013-78 Toru Kaise (Univ. of Hyogo)
(6) 16:05-16:30 Issues and Perspectives of Dependable LSI Design Koichiro Takayama, Akira Asato (Fujitsu)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Akira Asato (FUJITSU)
E--mail: a 

Last modified: 2013-09-25 15:02:06

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