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Technical Committee on Reliability (R) [schedule] [select]
Chair Naoto Kaio (Hiroshima Shudo Univ.)
Vice Chair Hitoshi Watanabe (Tokyo Univ. of Science)
Secretary Mitsuhiro Kimura (Hosei Univ.), Hiroyasu Mawatari (NTT)
Assistant Akira Asato (Fujitsu), Nobuyuki Tamura (National Defense Academy)

Technical Committee on Electromechanical Devices (EMD) [schedule] [select]
Chair Kiyoshi Yoshida (Nippon Inst. of Tech.)
Vice Chair Makoto Hasegawa (Chitose Inst. of Science and Tech.)
Secretary Junya Sekikawa (Shizuoka Univ.), Nobuhiro Kuga (Yokohama National Univ.)
Assistant Yasuhiro Hattori (Sumitomo Denso)

Conference Date Fri, Feb 18, 2011 13:00 - 17:10
Conference Place Hamamatsu Campus, Shizuoka University 
Transportation Guide
Sponsors This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is technical co-sponsored by Reliability Engineering Association of Japan.
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

Fri, Feb 18 PM 
13:00 - 17:10
  13:00-13:05 Opening Address ( 5 min. )
(1) 13:05-13:30 Peculiar Phenomena for Increase in Friction Coefficient due to Application of Lubrication R2010-42 EMD2010-143 Terutaka Tamai, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AN Lab.)
(2) 13:30-13:55 Direct Viewing of Current in Contact Area used by Light Emission Diode R2010-43 EMD2010-144 Shigeki Tsukiji, Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ.)
(3) 13:55-14:20 An experimental study on contact resistance characteristics of relay contacts in evaporated vapor atmospheres R2010-44 EMD2010-145 Makoto Hasegawa, Nanae Kobayashi (Chitose. Inst. of Sci. & Tech.), Yoshiyuki Kohno (Kaneka)
(4) 14:20-14:45 Measurement of Contact Resistance Distribution on Electrical Contact Surfaces Eroded by Break Arcs R2010-45 EMD2010-146 Yohei Yamanashi, Katsuyoshi Miyaji, Junya Sekikawa (Shizuoka Univ.), Takayoshi Kubono (Prof. Emeritus of Shizuoka Univ.)
  14:45-15:00 Break ( 15 min. )
(5) 15:00-15:25 Detection of degradation sign of LSI operation using IDDQ R2010-46 EMD2010-147 Shunsuke Sakamoto, Masaru Sanada (KUT)
(6) 15:25-15:50 Logic stabilization of unstable logic circuit with open fault R2010-47 EMD2010-148 Taiki Yasutomi, Masaru Sanada (KUT)
(7) 15:50-16:15 Statistical Quality Control based on Early Life Failure Rate for Electronic Components R2010-48 EMD2010-149 Toshinari Matsuoka (MELCO)
(8) 16:15-16:40 Thermal imaging method with Phase Microscopy R2010-49 EMD2010-150 Tomonori Nakamura, Hidenao Iwai, Toyohiko Yamauchi (HPK CRL), Hirotoshi Terada (HPK)
(9) 16:40-17:05 A Study on Plating Element and Solderbility for Ni/Sn Lath-like Intermetallic R2010-50 EMD2010-151 Sadanori Itou (itoken), Masafumi Suzuki (omron)
  17:05-17:10 Closing Add ( 5 min. )

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Kimura, Mitsuhiro (Hosei Univ.)
TEL 042-387-6116
FAX 042-387-6126
E--mail: mi 
EMD Technical Committee on Electromechanical Devices (EMD)   [Latest Schedule]
Contact Address Makoto Hasegawa(Chitose Inst. of Science and Technorogy)
TEL (0123)27-6059、FAX (0123)27-6059
E--mail: pn
Junya Sekikawa (Shizuoka Univ.)
TEL (053) 478-1618、FAX (053) 478-1618
E--mail: tjkipc
Yasuhiro Hattori(Sumitomo Wiring Systems, Ltd.)
TEL (059)382-8970、FAX (059)382-8591
E--mail: -tsws 
Announcement Latest information will be presented on the homepage:

Last modified: 2011-01-26 18:55:44

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