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Technical Committee on Reliability (R) [schedule] [select]
Chair Akira Asato (Fujitsu)
Vice Chair Tadashi Dohi (Hiroshima Univ.)
Secretary Nobuyuki Tamura (Hosei Univ.), Shinji Inoue (Kansai Univ.)
Assistant Hiroyuki Okamura (Hiroshima Univ.), Shinji Yokogawa (Univ. of Electro-Comm.)

Conference Date Thu, Nov 28, 2019 13:45 - 16:50
Topics Reliability of semiconductor and electronic devices, Reliability general 
Conference Place Central Electric Club, Room #215 
Address 2-1-25, Dojimahama, Kita-ku, Osaka, Osaka 530-004
Transportation Guide 12-minute walk distance from JR-Osaka Station, 6-minute walk distance from JR-Kitashinchi Station
Prof. Shinji Inoue
Sponsors This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Registration Fee This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on R.

Thu, Nov 28 PM 
13:45 - 16:50
(1) 13:45-14:10 A Note on Moment-Based Approximation for Uncertainty Propagation in Hierarchical Models R2019-43 Jiahao Zhang (Hiroshima Univ.), Junjun Zheng (Ritsumeikan Univ.), Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.)
(2) 14:10-14:35 Non-homogeneous Markov Process Modeling for Software Reliability Assessment R2019-44 Siqiao Li, Tadashi Dohi, Hiroyuki Okamura (Hiroshima U.)
(3) 14:35-15:00 Process-Oriented Software Reliability Modeling with Debugging Difficulties R2019-45 Shinji Inoue (Kansai Univ.), Shigeru Yamada (Tottori Univ.)
  15:00-15:10 Break ( 10 min. )
(4) 15:10-15:35 Research on improving the wettability of tin by forming a monolayer on the surface R2019-46 Takumi Hakozaki, Torann Minn Huku, Hiroyuki Saito (Tokyo Denki Univ.)
(5) 15:35-16:00 A Note on Optimal Rejuvenation Policies for Non-Markovian Availability Models with Aperiodic Checkpointing R2019-47 Junjun Zheng (Ritsumeikan Univ.), Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.)
(6) 16:00-16:25 Present Situation and Practical Issues on Functional Safety Software Development R2019-48 Takaji Fujiwara (SRATECH Lab), Shinji Inoue (Kansai Univ.)
(7) 16:25-16:50 Reliability Methodologies for Degradation Predictions Based on Hierarchical Bayesian Modeling and Machine Learning R2019-49 Toru Kaise, Toyohiko Egami (Univ. of Hyogo)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Hiroyuki Okamura (Hiroshima Univ.)
E--mail: -u 

Last modified: 2019-09-19 10:51:12

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