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Technical Committee on Reliability (R) [schedule] [select]
Chair Mitsuhiro Kimura (Hosei Univ.)
Vice Chair Hiroyasu Mawatari (NTT)
Secretary Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.)
Assistant Nobuyuki Tamura (Hosei Univ.), Maratt Zanikef (Kyushu Inst. of Tech.)

Technical Committee on Electromechanical Devices (EMD) [schedule] [select]
Chair Makoto Hasegawa (Chitose Inst. of Science and Tech.)
Vice Chair Junya Sekikawa (Shizuoka Univ.), Nobuhiro Kuga (Yokohama National Univ.)
Secretary Yasuhiro Hattori (Sumitomo Denso), Yoshiteru Abe (NTT)
Assistant Takahiro Ueno (Nippon Inst. of Tech.)

Conference Date Fri, Feb 21, 2014 13:00 - 17:15
Topics  
Conference Place  
Sponsors This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is technical co-sponsored by Reliability Engineering Association of Japan.
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

Fri, Feb 21 PM 
13:00 - 17:15
  13:00-13:05 Opening AddressBreak ( 5 min. )
(1) 13:05-13:30 The current international standardization on reliability analysis for relays
-- Progress of activities in IEC/TC94 --
R2013-84 EMD2013-140
Takeshi Aoki (TKG), Yoshihisa Oikawa (Tyco electronics Japan)
(2) 13:30-13:55 Characteristics of Electric Contact Behavior in Boundary Arc Area
-- (IV) Oxidative Condition of Siloxane --
R2013-85 EMD2013-141
Yoshiro Yoshida (ALPS Electric)
(3) 13:55-14:20 Three-dimensional comparisons of damage shapes on Ag and AgSnO2 contact surfaces caused by break arc discharges R2013-86 EMD2013-142 Makoto Hasegawa, Daichi Kawamura (Chitose Inst. of Science and Tech.)
  14:20-14:30 Break ( 10 min. )
(4) 14:30-14:55 Effect of self-magnetic field on current flowing through true contact area R2013-87 EMD2013-143 Terutaka Tamai (Elcontech), Shigeru Sawada, Yasuhiro Hattori (AutoNetworks)
(5) 14:55-15:20 Study on contact oil in electrical contacts R2013-88 EMD2013-144 Koji Kojima, Kazuo Iida (Mie Univ.), Shigeru Sawada (ANTech)
(6) 15:20-15:45 HomeBox Virtual: A New Paradigm for End-to-End Services Based on VM Visitation Platforms R2013-89 EMD2013-145 Marat Zhanikeev (Kyushu Inst. of Tech.)
  15:45-15:55 Break ( 10 min. )
(7) 15:55-16:20 Reliability assessment of the electromagnetic noise from fluorescent lighting equipment R2013-90 EMD2013-146 Kazuaki Wakai (Diichi Inst. of Tech.)
(8) 16:20-16:45 Study on HPCF connector attenuation (2) R2013-91 EMD2013-147 Tadahisa Iikubo, Ryo Nagase (Chiba Inst. of Tech.)
(9) 16:45-17:10 Pressure sensing technique using Band-pass filter On Fiber-end (3) R2013-92 EMD2013-148 Kentaro Matsuda, Ryo Nagase (Chiba Inst. of Tech.)
  17:10-17:15 Closing Address ( 5 min. )

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Akira Asato (FUJITSU)
E-: a 
EMD Technical Committee on Electromechanical Devices (EMD)   [Latest Schedule]
Contact Address Junya Sekikawa (Shizuoka Univ.)
TEL (053) 478-1618、FAX (053) 478-1618
E-: tjkipc
Nobuhiro Kuga(Yokohama National Univ.)
TEL (045)339-4279、FAX (045)339-4279
E-: y
Yasuhiro Hattori(Sumitomo Wiring Systems, Ltd.)
TEL (059)382-8634、FAX (059)382-8591
E-: -tsws
Yoshiteru Abe(NTT Photonics Lab.)]
TEL (046)240-2262、FAX (046)270-6421
E-: abe 
Announcement Latest information will be presented on the homepage:
http://www.ieice.org/es/emd/jpn/


Last modified: 2013-12-13 12:40:41


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