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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2020-02-26 14:10 |
Tokyo |
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A Don’t Care Identification-Filling Co-Optimization Method for Low Power Testing Using Partial Max-SAT Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ), Masayuki Arai (Nihon Univ) DC2019-92 |
Recently, in at-speed scan testing, excessive capture power dissipation is a serious problem. Low capture power test gen... [more] |
DC2019-92 pp.37-42 |
DC |
2019-02-27 09:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ) DC2018-73 |
Low power oriented don't care (X) identification and X filling methods have been proposed to reduce the numbers of captu... [more] |
DC2018-73 pp.13-18 |
NLP |
2014-01-22 11:40 |
Hokkaido |
Niseko Park Hotel |
Analysis of a Dendritic Network Based on an Asynchronous Cellular Automaton Naoki Shimada (Osaka Univ.), Hiroyuki Torikai (Kyouto Sangyo Univ.) NLP2013-151 |
The neuron is roughly divided into three parts: soma, dendrite, and axon.
In this paper, a multi-compartment neuron mod... [more] |
NLP2013-151 pp.117-122 |
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