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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2020-02-26
Tokyo   A Don’t Care Identification-Filling Co-Optimization Method for Low Power Testing Using Partial Max-SAT
Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ), Masayuki Arai (Nihon Univ) DC2019-92
Recently, in at-speed scan testing, excessive capture power dissipation is a serious problem. Low capture power test gen... [more] DC2019-92
DC 2019-02-27
Tokyo Kikai-Shinko-Kaikan Bldg. A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors
Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ) DC2018-73
Low power oriented don't care (X) identification and X filling methods have been proposed to reduce the numbers of captu... [more] DC2018-73
NLP 2014-01-22
Hokkaido Niseko Park Hotel Analysis of a Dendritic Network Based on an Asynchronous Cellular Automaton
Naoki Shimada (Osaka Univ.), Hiroyuki Torikai (Kyouto Sangyo Univ.) NLP2013-151
The neuron is roughly divided into three parts: soma, dendrite, and axon.
In this paper, a multi-compartment neuron mod... [more]
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