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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| ICD | 2024-04-11 13:50 |
Kanagawa | (Primary: On-site, Secondary: Online) |
[Invited Lecture]
A 22 nm 10.8 Mb Embedded STT MRAM Macro Achieving over 200 MHz Random Read Access and a 10.4 MB/s Write Throughput for High End MCUs Masayuki Izuna, Tomoya Ogawa, Ken Matsubara, Yasuhiko Taito, Tomoya Saito, Koichi Takeda, Yoshinobu Kaneda, Takahiro Shimoi, Hidenori Mitani, Takashi Ito, Takashi Kono (Renesas Electronics)  ICD2024-6 |
(To be available after the conference date) [more] | ICD2024-6 pp.18-19 |
| ICD | 2023-04-10 11:00 |
Kanagawa | (Primary: On-site, Secondary: Online) |
[Invited Lecture]
A 22nm 32Mb Embedded STT-MRAM Macro Achieving 5.9ns Random Read Access and 5.8MB/s Write Throughput at up to Tj of 150 °C Takahiro Shimoi, Ken Matsubara, Tomoya Saito, Tomoya Ogawa, Yasuhiko Taito, Yoshinobu Kaneda, Masayuki Izuna, Koichi Takeda, Hidenori Mitani, Takashi Ito, Takashi Kono (Renesas Electronics) ICD2023-2 |
This paper presents a high-precision sense amplifier and a fast write throughput technique of a 32Mb embedded STT-MRAM m... [more] | ICD2023-2 p.7 |
| ICD | 2023-04-11 09:30 |
Kanagawa | (Primary: On-site, Secondary: Online) |
[Invited Lecture]
Development of A Variation-Tolerant Processing-In-Memory Architecture Using Discharging Current Calibration Daiki Kitagata, Shinji Tanaka, Naoya Fujita, Naoaki Irie (REL) ICD2023-8 |
Processing-in-memory (PIM) has recently been expected to be a key technology for endpoint intelligence since it can dram... [more] | ICD2023-8 p.16 |
| SDM | 2022-10-19 14:30 |
Online | Online | The effect of microstructures of CrSiC thin film resistors on the electrical properties Nozomi Ito, Kazuyoshi Maekawa, Yuji Takahashi, Takashi Tonegawa (Renesas) SDM2022-59 |
With the recent trend toward higher integration of electronic circuits, the combination of an analog front end (AFE) and... [more] | SDM2022-59 pp.20-23 |
| ICD, SDM, ITE-IST [detail] | 2022-08-10 15:15 |
Online | [Invited Talk]
A CMOS Image Sensor and an AI Accelerator for Realizing Edge-Computing-Based Surveillance Camera Systems Fukashi Morishita, Norihito Kato, Satoshi Okubo, Takao Toi, Mitsuru Hiraki, Sugako Otani, Hideaki Abe, Yuji Shinohara, Hiroyuki Kondo (Renesas Electronics) SDM2022-52 ICD2022-20 |
This paper presents a CMOS image sensor and an AI accelerator to realize surveillance camera systems based on edge compu... [more] | SDM2022-52 ICD2022-20 pp.83-86 |
|
| SDM | 2021-11-12 10:30 |
Online | Online | [Invited Talk]
Full band Monte Carlo analysis of the uniaxial stress impact on 4H-SiC high energy transport Tomoya Nishimura, Katsumi Eikyu, Kenichiro Sonoda, Tamotsu Ogata (Renesas Electronics) SDM2021-61 |
SiC is expected to be the next-generation semiconductor material especially for power devices, and some have been put in... [more] | SDM2021-61 pp.43-46 |
| SDM, ICD, ITE-IST [detail] | 2021-08-18 13:00 |
Online | Online | [Invited Talk]
A 12nm autonomous driving processor running 60.4 TOPS and 13.8 TOPS/W CNNs with task-separated ASIL D control Katsushige Matsubara, Lieske Hanno (Renesas Electronics), Motoki Kimura (Renesas Electronics Europe), Atsushi Nakamura, Manabu Koike, Kazuaki Terashima, Shun Morikawa, Yoshihiko Hotta, Takahiro Irita, Seiji Mochizuki, Hiroyuki Hamasaki, Tatsuya Kamei (Renesas Electronics) SDM2021-39 ICD2021-10 |
Next-generation driver assistance systems and automated driving systems require both high performances to realize enormo... [more] | SDM2021-39 ICD2021-10 pp.48-53 |
| DC | 2021-02-05 14:25 |
Online | Online | Fault Coverage Estimation Method in Multi-Cycle Testing Norihiro Nakaoka, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas Electronics Corp.) DC2020-75 |
[more] | DC2020-75 pp.36-41 |
| SDM | 2020-11-19 15:20 |
Online | Online | [Invited Talk]
A technique for phase-detection auto focus under near-infrared-ray incidence in a back-side illuminated CMOS image sensor pixel Tatsuya Kunikiyo, Hidenori Sato, Takeshi Kamino, Koji Iizuka, Ken'ichiro Sonoda, Tomohiro Yamashita (Renesas Electronics) SDM2020-26 |
A novel phase-detection auto focus (PDAF) technique for incident 850 nm plane wave is demonstrated using Ge-on-Si layer ... [more] | SDM2020-26 pp.21-24 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2020-11-17 11:20 |
Online | Online | Control Point Selection Approach for Scan Pattern Reduction under Multi-cycle Test Hikaru Tamaki, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34 |
[more] | VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34 pp.24-29 |
| DC | 2020-02-26 10:25 |
Tokyo | Defective Chip Prediction Modeling Using Convolutional Neural Networks Ryunosuke Oka, Satoshi Ohtake (Oita Univ.), Kouichi Kumaki (Renesas) DC2019-87 |
In recent years, the cost of LSI testing which guarantees reliability has relatively increased due to the development of... [more] | DC2019-87 pp.7-12 |
|
| DC | 2020-02-26 11:35 |
Tokyo | Method for Inserting Fault-Detection-Strengthened Test Point under Multi-cycle Testing Tomoki Aono, Norihiro Nakaoka, Shyu Saikou, Wang Senling, Higami Yoshinobu, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Youichi Maeda, Jun Matsushima (Renesas) DC2019-89 |
For guaranteeing the functional safety of an in-vehicle system, a power-on self-test (POST) is required to test the devi... [more] | DC2019-89 pp.19-24 |
|
| VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-14 16:10 |
Ehime | Ehime Prefecture Gender Equality Center | Analysis of Fault Detection Degradation Issue in Multi-cycle Test Scheme using Probabilistic Evaluation Method Norihiro Nakaoka, Tomoki Aono, Sohshi Kudoh, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2019-45 DC2019-69 |
In order to ensure the functional safety of advanced autonomous driving systems, a power-on self-test (POST) is require... [more] |
VLD2019-45 DC2019-69 pp.145-150 |
| SDM, ICD, ITE-IST [detail] | 2019-08-07 16:30 |
Hokkaido | Hokkaido Univ., Graduate School /Faculty of Information Science and | [Invited Talk]
High-temperature stable Physical Unclonable Functions with error-free readout scheme based on 28nm SGMONOS flash memory for security applications Takahiro Shimoi, Tomoya Saito, Hirokazu Nagase, Masayuki Izuna, Akihiko Kanda, Takashi Ito, Takashi Kono (Renesas Electronics) SDM2019-39 ICD2019-4 |
Highly reliable Physical Unclonable Functions (PUF) based on 28nm Split-Gate MONOS (SG-MONOS) embedded flash memory is d... [more] | SDM2019-39 ICD2019-4 pp.15-19 |
| SDM, ICD, ITE-IST [detail] | 2019-08-09 10:50 |
Hokkaido | Hokkaido Univ., Graduate School /Faculty of Information Science and | [Invited Talk]
A 28nm 600MHz Automotive Flash Microcontroller with Virtualization-Assisted Processor for Next-Generation Automotive Architecture supporting ISO26262 ASIL-D Naoto Okumura, Sugako Otani, Norimasa Otsuki, Yasufumi Suzuki, Shohei Maeda, Tomonori Yanagita, Takao Koike, Masao Ito, Minoru Uemura, Yasuhisa Shimazaki, Toshihiro Hattori, Noriaki Sakamoto, Hiroyuki Kondo (Renesas Electronics Corp.) SDM2019-47 ICD2019-12 |
Along with the rapid progress of automotive Electrical/Electronic(E/E) architecture, further integration of multiple ele... [more] | SDM2019-47 ICD2019-12 pp.67-71 |
| CAS, CS | 2019-03-08 15:00 |
Kanagawa | Shonan Institute of Technology | [Special Invited Talk]
The latest trends of Automotive Ethernet Tomofumi Hokari, Nobukatsu Kitajima (Renesas) CAS2018-145 CS2018-113 |
To support Autonomous driving and Connected car applications, Automotive Ethernet has been adopted widely around the wor... [more] | CAS2018-145 CS2018-113 p.39 |
| DC | 2019-02-27 09:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Variational Autoencoder-Based Efficient Test Escape Detection Michihiro Shintani (NAIST), Kouichi Kumaki (Renesas Electronics Corporation), Michiko Inoue (NAIST) DC2018-72 |
[more] | DC2018-72 pp.7-12 |
| HWS (2nd) |
2018-12-13 15:05 |
Tokyo | Tokyo Univ. Takeda Bldg. Takeda Hall | Issues in industrial equipment installed in the factory and Renesas' initiatives Tsukasa Yobo (Renesas Electronics) |
(Advance abstract in Japanese is available) [more] | |
| SDM, ICD, ITE-IST [detail] | 2018-08-09 13:10 |
Hokkaido | Hokkaido Univ., Graduate School of IST M Bldg., M151 | 12-nm Fin-FET 3.0G-search/s 80-bit x 128-entry Dual-port Ternary CAM Makoto Yabuuchi, Masao Morimoto, Koji Nii, Shinji Tanaka (Renesas) SDM2018-48 ICD2018-35 |
[more] | SDM2018-48 ICD2018-35 pp.115-120 |
| ICD | 2018-04-20 10:20 |
Tokyo | [Invited Lecture]
An Implementation of 2RW Dual-Port SRAM using 65 nm Silicon-on-Thin-Box (SOTB) for Smart IoT Yohei Sawada, Yoshiki Yamamoto, Takumi Hasegawa, Hiroki Shinkawata, Makoto Yabuuchi (REL), Yoshihiro Shinozaki, Kyoji Ito (NSW), Shinji Tanaka, Nii Koji, Shiro Kamohara (REL) ICD2018-8 |
[more] | ICD2018-8 pp.29-32 |
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