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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD |
2012-03-26 14:50 |
Osaka |
Osaka Univ. |
[Invited Talk]
data transmission systems for a neural recording chips Takeshi Yoshida (Hiroshima Univ.), Masahiro Ono (A-R-Tec), Hiroshi Ando (Hiroshima Univ.), Yoshitaka Murasaka, Atsushi Iwata (A-R-Tec), Kojiro Matsushita, Masayuki Hirata (Osaka Univ.), Takafumi Suzuki (The University of Tokyo) ICD2011-150 |
To improve the Quality of Life (QoL) of the severely disabled people, the brain-machine interface (BMI) and multi-channe... [more] |
ICD2011-150 pp.29-34 |
ICD, ITE-IST |
2011-07-21 11:20 |
Hiroshima |
Hiroshima Institute of Technology |
64ch Neural Recording Chip for Human Brain-Machine Interfaces Takeshi Yoshida, Katsuya Sueishi (Hiroshima Univ.), Masahiro Ono (A-R-Tec), Hiroshi Ando (Hiroshima Univ.), Yoshitaka Murasaka, Atsushi Iwata (A-R-Tec), Kojiro Matsushita, Masayuki Hirata (Osaka Univ.), Takafumi Suzuki (Univ. of Tokyo) ICD2011-23 |
To improve the Quality of Life (QoL) of the severely disabled people, the brain-machine interface (BMI) and multi-channe... [more] |
ICD2011-23 pp.25-30 |
ICD, ITE-IST |
2009-10-01 09:35 |
Tokyo |
CIC Tokyo (Tamachi) |
A 6-bit Arbitrary Digital Noise Emulator in 65nm CMOS Technology Daisuke Fujimoto, Tetsuro Matsuno (Kobe Univ.), Daisuke Kosaka (A-R-Tec), Naoyuki Hamanishi, Ken Tanabe, Masazumi Shiochi (Toshiba Corp.), Makoto Nagata (Kobe Univ./A-R-Tec) ICD2009-34 |
An arbitrary noise generator (ANG) is based on time-series charging of divided parasitic capacitance
(TSDPC) and emulat... [more] |
ICD2009-34 pp.7-10 |
ICD, ITE-IST |
2009-10-01 10:00 |
Tokyo |
CIC Tokyo (Tamachi) |
Evaluation and Analysis of Substrate Noise in Microprocessor Yoji Bando (Kobe Univ.), Daisuke Kosaka (A-R-Tec), Goichi Yokomizo, Kunihiko Tsuboi (STARC), Ying Shiun Li, Shen Lin (Apache), Makoto Nagata (Kobe Univ./A-R-Tec) ICD2009-35 |
An integrated power and substrate noise analysis environment targeting systems-on-chip (SoC) design was verified through... [more] |
ICD2009-35 pp.11-14 |
ICD, ITE-IST |
2009-10-02 11:00 |
Tokyo |
CIC Tokyo (Tamachi) |
[Invited Talk]
AD Conversion Principles and CMOS Circuit Techniques Atsushi Iwata (A-R-Tec) ICD2009-50 |
Many kinds of AD conversion schemes of Successive approximation, Flash, Pipelined, Delta Sigma, were proposed and integr... [more] |
ICD2009-50 pp.93-98 |
EMCJ |
2009-04-24 16:40 |
Okayama |
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[Special Talk]
* Atsushi Iwata (Hiroshima Univ./A-R-Tec Corp.,) EMCJ2009-8 |
Based on accurate noise measurement techniques and simulation models for supply/substrate noise, effects of crosstalk no... [more] |
EMCJ2009-8 pp.39-44 |
ICD, ITE-IST |
2007-07-26 09:45 |
Hyogo |
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On-Die Supply-Voltage Noise Sensor with Real-Time Sampling Mode for Low-Power Processor Applications Tomio Sato, Atsuki Inoue, Tetsuyoshi Shiota, Tomoko Inoue, Yukihito Kawabe, Tetsutaro Hashimoto (Fujitsu Lab.), Toshifumi Imamura, Yoshitaka Murasaka, Makoto Nagata, Atsushi Iwata (A-R-Tec) ICD2007-40 |
The real time on-die noise sensor reported here can continuously detect up to 100 noise events per a second without dist... [more] |
ICD2007-40 pp.17-22 |
ICD, VLD |
2007-03-07 16:40 |
Okinawa |
Mielparque Okinawa |
Equivalent Circuit Modeling of Guard Ring Structures for Evaluation of Substrate Crosstalk Isolation Daisuke Kosaka, Makoto Nagata (Kobe Univ.), Yoshitaka Murasaka, Atsushi Iwata (A-R-Tec) |
A substrate-coupling equivalent circuit can be derived for an arbitrary
guard ring test structure by way of F-matrix co... [more] |
VLD2006-115 ICD2006-206 pp.55-60 |
ICD, ITE-CE |
2006-12-14 16:05 |
Hiroshima |
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Floating Point Wide Range CMOS Image Sensor Using Multiple Sampling and Wireless Interconnection Hossain Quazi Delwar (Hiroshima Univ.), Toshifumi Imamura (A-R Tec Corp.), Mamoru Sasaki, Atsushi Iwata (Hiroshima Univ.) |
[more] |
ICD2006-155 pp.67-71 |
ICD, ITE-IST |
2006-07-27 10:00 |
Shizuoka |
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Evaluation of Digital Crosstalk Noise to fully DIfferential VCO Akihiro Toya (Hiroshima Univ.), Yoshitaka Murasaka, Takafumi Ohmoto (A-R-Tec Corp.), Atsushi Iwata (Hiroshima Univ.) |
In accordance with the rapid increase of operation frequencies of CMOS circuits, radio-frequency system-on-a-chip (RF-SO... [more] |
ICD2006-60 pp.1-6 |
ICD, SDM |
2005-08-18 13:25 |
Hokkaido |
HAKODATE KOKUSAI HOTEL |
Isolation Strategy against Substrate Coupling in CMOS Mixed-Signal/RF Circuits Daisuke Kosaka, Makoto Nagata (Kobe Univ.), Yoshitaka Murasaka, Atsushi Iwata (A-R-Tec Corp.) |
A deep n-well guard-ring, DNW-GR, provides effective isolation from substrate-coupled high frequency noises in combinati... [more] |
SDM2005-136 ICD2005-75 pp.49-54 |
ICD |
2005-07-14 09:55 |
Aichi |
Toyohashi Univ. of Tech. |
Evaluation of Digital Crosstalk Noise to CMOS-PLL through Si Substrate Akihiro Toya, Ayako Kouno, Atsushi Iwata (Hiroshima Univ.), Makoto Nagata (Kobe Univ.), Yoshitaka Murasaka (A-R-Tec) |
[more] |
ICD2005-41 pp.7-12 |
ICD |
2005-05-27 16:40 |
Hyogo |
Kobe Univ. |
Substrate Integrity Beyond 1GHz Mitsuya Fukazawa, Makoto Nagata (Kobe Univ.), Naoyuki Hamanishi, Masazumi Shiochi, Tetsuya Iida (Toshiba Corp.), Junichiro Watanabe (Toshiba Information Systems(Japan) Corp.), Yoshitaka Murasaka, Atsushi Iwata (A-R-Tec Corp.) |
(Advance abstract in Japanese is available) [more] |
ICD2005-39 pp.61-64 |
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