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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2004-12-10
Aichi Nagoya Institute of Technology A Study on Measurement of LSI Immunity for PCB Analysis
Kouji Ichikawa, Yukihiko Sakurai, Masashi Inagaki, Takeshi Matsui (DENSO), Yuichi Mabuchi (Hitachi), Atsushi Nakamura, Toru Hayashi (Renesas Technology)
We have been developing an LSI model for EMS simulation in automotive electronic control units.
PCB immunity was analyz... [more]
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