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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
AP |
2009-10-08 16:00 |
Shizuoka |
Shizuoka University |
Positioning System for the Passive RFID Tag Hideki Nakamura, Yoshihiko Kuwahara (Shizuoka Univ.), Kazuo Ishida, Masayoshi Kai (NECST) AP2009-117 |
In this report, positioning system for the passive RFID tag is presented. The antenna aperture is composed of 2
4-eleme... [more] |
AP2009-117 pp.85-90 |
VLD |
2009-09-24 15:25 |
Osaka |
Osaka University |
A System LSI Design and Verification Environment Using JACKAL Language Takafumi Kohara (Kinki Univ.), Ryuichi Nakawaki (FUJITSU FSAS), Yasuhiro Nagata (NEC System Techno.), Takashi Kambe (Kinki Univ.) VLD2009-33 |
We have been developing an object oriented design system based on “Jackal” language. This System enables us to design an... [more] |
VLD2009-33 pp.25-30 |
SIS |
2008-12-04 13:55 |
Osaka |
Kansai Univ. |
Trial Manufacturing and Evaluation of the Direction Finder for Passive RFID Tag Yoshihiko Kuwahara, Hideki Nakamura (Shizuoka Univ.), Masayoshi Kai (NEC System Technologies, Ltd) |
In this report, trial manufacturing and evaluation test results of the direction finder for the passive RFID tag are pre... [more] |
SIS2008-50 pp.45-50 |
SS, KBSE |
2007-04-19 14:20 |
Fukushima |
Univ. of Aizu |
A Study of Unit Testing with Orthogonal Array
-- A Support Tool for JUnit -- Akira Yamada (NEC), Hirohisa Aman, Yuzo Takamatsu (Ehime Univ.) SS2007-1 KBSE2007-1 |
In recent years, the orthogonal array has been a key topic to enhance software testing.
The orthogonal array can be use... [more] |
SS2007-1 KBSE2007-1 pp.1-6 |
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