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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
AP 2009-10-08
16:00
Shizuoka Shizuoka University Positioning System for the Passive RFID Tag
Hideki Nakamura, Yoshihiko Kuwahara (Shizuoka Univ.), Kazuo Ishida, Masayoshi Kai (NECST) AP2009-117
In this report, positioning system for the passive RFID tag is presented. The antenna aperture is composed of 2
4-eleme... [more]
AP2009-117
pp.85-90
VLD 2009-09-24
15:25
Osaka Osaka University A System LSI Design and Verification Environment Using JACKAL Language
Takafumi Kohara (Kinki Univ.), Ryuichi Nakawaki (FUJITSU FSAS), Yasuhiro Nagata (NEC System Techno.), Takashi Kambe (Kinki Univ.) VLD2009-33
We have been developing an object oriented design system based on “Jackal” language. This System enables us to design an... [more] VLD2009-33
pp.25-30
SIS 2008-12-04
13:55
Osaka Kansai Univ. Trial Manufacturing and Evaluation of the Direction Finder for Passive RFID Tag
Yoshihiko Kuwahara, Hideki Nakamura (Shizuoka Univ.), Masayoshi Kai (NEC System Technologies, Ltd)
In this report, trial manufacturing and evaluation test results of the direction finder for the passive RFID tag are pre... [more] SIS2008-50
pp.45-50
SS, KBSE 2007-04-19
14:20
Fukushima Univ. of Aizu A Study of Unit Testing with Orthogonal Array -- A Support Tool for JUnit --
Akira Yamada (NEC), Hirohisa Aman, Yuzo Takamatsu (Ehime Univ.) SS2007-1 KBSE2007-1
In recent years, the orthogonal array has been a key topic to enhance software testing.
The orthogonal array can be use... [more]
SS2007-1 KBSE2007-1
pp.1-6
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