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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM |
2016-10-27 13:00 |
Miyagi |
Niche, Tohoku Univ. |
[Invited Talk]
Novel Pixel Structure with Stacked Deep Photodiode to Achieve High NIR Sensitivity and High MTF Hiroki Takahashi, Hiroshi Tanaka, Masahiro Oda, Mitsuyoshi Ando, Naoto Niisoe (TPSCo), Shinichi Kawai, Takuya Asano, Mitsugu Yoshita, Tohru Yamada (PSCS) SDM2016-77 |
Novel pixel structure with Stacked Deep Photodiode (SDP) has been newly developed for both high Near Infra-Red (NIR) sen... [more] |
SDM2016-77 pp.45-48 |
ICD, SDM, ITE-IST [detail] |
2016-08-01 14:30 |
Osaka |
Central Electric Club |
[Invited Talk]
Novel Pixel Structure with Stacked Deep Photodiode to Achieve High NIR Sensitivity and High MTF Hiroki Takahashi, Hiroshi Tanaka, Masahiro Oda, Mitsuyoshi Ando, Naoto Niisoe (TPSCo), Shinichi Kawai, Takuya Asano, Mitsugu Yoshita, Tohru Yamada (PSCS) SDM2016-51 ICD2016-19 |
Novel pixel structure with Stacked Deep Photodiode (SDP) has been newly developed for both high Near Infra-Red (NIR) sen... [more] |
SDM2016-51 ICD2016-19 pp.41-44 |
AP |
2006-10-19 10:20 |
Kyoto |
Kyoto Univ. (Katsura Campus) |
Determination Scheme of Effective Building Area for Ray-tracing Calculation Shinnichi Kawai, Yukiko Sanoh, Masahiko Kawamura (KKE), Yoshio Karasawa (UEC) AP2006-78 |
[more] |
AP2006-78 pp.11-16 |
AP |
2006-02-16 13:00 |
Kanagawa |
Toshiba Kenshuu Center(Yokohama) |
Frequency Characteristics of Reflection and Diffraction Coefficient applied to UWB using Ray-tracing Method Shinnichi Kawai, Yukiko Sanoh, Masahiko Kawamura (KKE) |
[more] |
AP2005-163 pp.25-30 |
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