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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2021-12-01 09:20 |
Online |
Online |
Soft Errors on Flip-flops Depending on Circuit and Layout Structures Estimated by TCAD Simulations Moeka Kotani, Ryuichi Nakajima (KIT), Kazuya Ioki (ROHM), Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2021-17 ICD2021-27 DC2021-23 RECONF2021-25 |
We compare the soft error tolerance of conventional flip-flops (FFs) and the proposed radiation-hard FF with small area,... [more] |
VLD2021-17 ICD2021-27 DC2021-23 RECONF2021-25 pp.1-6 |
VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-28 14:15 |
Osaka |
Ritsumeikan University, Osaka Ibaraki Campus |
Evaluation of Radiation-Hard Circuit Structures in a FDSOI Process by TCAD Simulations Kodai Yamada, Haruki Maruoka, Shigehiro Umehara, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2016-49 DC2016-43 |
According to the Moore's law, LSIs are miniaturized and the
reliability of LSIs is degraded. To improve the tolerance ... [more] |
VLD2016-49 DC2016-43 pp.31-36 |
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