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 Results 1 - 7 of 7  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ITS, IE, ITE-MMS, ITE-ME, ITE-AIT [detail] 2024-02-19
15:15
Hokkaido Hokkaido Univ. A prototype study on External Human Machine Interface (HMI) for automated bus -- Virtual Reality (VR) reproduction of real experiment environment --
Sota Suzuki (AIST/TUS), Yanbin Wu, Kumagai Toru, Masaki Masuda, Koya Takahashi, Naohisa Hashimoto (AIST), Satoru Ogino (AIST/TUS), Makoto Itami (TUS) ITS2023-58 IE2023-47
 [more] ITS2023-58 IE2023-47
pp.68-71
ITS, WBS, RCC 2023-12-22
11:20
Okinawa
(Primary: On-site, Secondary: Online)
Study on intention display by external HMI in automated vehicles
Hiromu Saito, Jeyeon Kim (NITTC), Yanbin Wu, Masaki Masuda, Toru Kumagai, Naohisa Hashimoto (AIST) WBS2023-54 ITS2023-37 RCC2023-48
In recent years, the introduction of automated vehicles has been considered as a solution to problems such as impact of ... [more] WBS2023-54 ITS2023-37 RCC2023-48
pp.134-137
ICD, CPSY 2015-12-18
09:00
Kyoto Kyoto Institute of Technology Evaluation of Soft Error Tolerance of Redundant Flip-Flop in 65nm Bulk and FD-SOI Processes.
Eiji Sonezaki, Kubota Kanto, Masaki Masuda, Shohei Kanda, Jun Furuta, Kazutoshi Kobayashi (KIT) ICD2015-83 CPSY2015-96
According to process down scaling, LSI becomes less reliable for soft errors. To increase the tolerance of FFs for soft ... [more] ICD2015-83 CPSY2015-96
pp.69-74
VLD 2013-03-06
15:35
Okinawa Okinawa Seinen Kaikan Robust Redundant Circuit Structure to Mitigate Wearout by Reversing Register Values
Shogo Okada, Masaki Masuda (Kyoto Inst. of Tech.), Jun Yao, Hajime Shimada (NAIST), Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2012-162
 [more] VLD2012-162
pp.147-152
ICD 2012-12-18
11:45
Tokyo Tokyo Tech Front A 65 nm Low-Power Adaptive-Coupling Redundant Flip-Flop
Masaki Masuda, Kanto Kubota, Ryosuke Yamamoto (KIT), Jun Furuta (Kyoto Univ.), Kazutoshi Kobayashi (KIT), Hidetoshi Onodera (Kyoto Univ.) ICD2012-117
We propose a low-power redundant flip-flop to be operated with high reliability over 1 GHz clock frequency based on the ... [more] ICD2012-117
pp.109-113
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2012-11-26
16:25
Fukuoka Centennial Hall Kyushu University School of Medicine A Low-Power and Area-Efficient Radiation-Hard Redundant Flip-Flop -- DICE ACFF --
Kanto Kubota, Masaki Masuda, Kazutoshi Kobayashi (KIT) VLD2012-71 DC2012-37
 [more] VLD2012-71 DC2012-37
pp.69-74
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2011-11-28
13:25
Miyazaki NewWelCity Miyazaki Performance Evaluation of Soft-Error Tolerant Multiple Modular Processors Implemented with Redundant and Non-Redundant Flip-Flops
Shogo Okada, Masaki Masuda (KIT), Jun Yao, Hajime Shimada (NAIST), Kazutoshi Kobayashi (KIT) VLD2011-59 DC2011-35
Soft-error rates are becoming larger due to process scaling. Various ways of prediction for soft-error
are being tried.... [more]
VLD2011-59 DC2011-35
pp.43-48
 Results 1 - 7 of 7  /   
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