Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] |
2023-11-16 16:45 |
Kumamoto |
Civic Auditorium Sears Home Yume Hall (Primary: On-site, Secondary: Online) |
Wearable Perspiration Meter System with 0.18 µm BCD Process and Experimental Investigations for High Precision Shunsaku Mineo, Ayumu Yamamoto (Shinshu Univ.), Shin-Ichiro Kuroki (Hiroshima Univ.), Hideya Momose (SKINOS), Koh Johguchi (Shinshu Univ.) VLD2023-57 ICD2023-65 DC2023-64 RECONF2023-60 |
This paper presents a wearable perspiration monitoring system to enhance the accuracy. The proposed system circulates ai... [more] |
VLD2023-57 ICD2023-65 DC2023-64 RECONF2023-60 pp.140-145 |
ICD, IPSJ-ARC |
2015-01-29 14:45 |
Kanagawa |
|
Analysis of Relation between Performance and Reliability of NAND Flash memory/Storage-class memory Hybrid SSD Hirofumi Takishita (Chuo Univ), Shuhei Tanakamaru (Chuo Univ/Univ. of Tokyo), Shogo Hosaka, Koh Johguchi, Ken Takeuchi (Chuo Univ) ICD2014-111 |
[more] |
ICD2014-111 pp.7-12 |
ICD |
2014-04-17 11:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Requirements for Performance of Non-Volatile Memories in 3D TSV-Integrated Hybrid ReRAM/MLC NAND Solid-State Drive Kousuke Miyaji (Chuo Univ.), Hiroki Fujii (Univ. of Tokyo), Koh Johguchi (Chuo Univ.), Kazuhide Higuchi, Chao Sun (Univ. of Tokyo), Ken Takeuchi (Chuo Univ.) ICD2014-3 |
[more] |
ICD2014-3 pp.9-14 |
ICD |
2014-04-17 12:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Design of Exchangeable MLC/TLC Hybrid Storage Array for Big Data Shogo Hachiya, Koh Johguchi (Chuo Univ.), Kousuke Miyaji (Shinshu Univ.), Ken Takeuchi (Chuo Univ.) ICD2014-5 |
A TLC-NAND flash provides a low cost and high capacity memory solution. However the reliability and access latency of TL... [more] |
ICD2014-5 pp.21-26 |
ICD |
2014-01-28 15:00 |
Kyoto |
Kyoto Univ. Tokeidai Kinenkan |
[Poster Presentation]
Performance Analysis of the Hybrid SSDs with NAND Flash Memory/Storage Class Memory Shogo Hosaka (Chuo Univ.), Shuhei Tanakamaru (Chuo Univ./Univ. of Tokyo), Koh Johguchi, Ken Takeuchi (Chuo Univ.) ICD2013-113 |
flash memory/storage class memory (SCM) hybrid solid-state drives (SSDs) achieve high performance and low consumption co... [more] |
ICD2013-113 p.35 |
ICD |
2014-01-28 15:00 |
Kyoto |
Kyoto Univ. Tokeidai Kinenkan |
[Poster Presentation]
3-D Packaging Method for Low Power Hybrid SSD Tomoya Ishii, Koh Johguchi, Ken Takeuchi (Chuo Univ.) ICD2013-119 |
[more] |
ICD2013-119 p.47 |
ICD |
2014-01-29 13:00 |
Kyoto |
Kyoto Univ. Tokeidai Kinenkan |
[Invited Talk]
Next-Generation Solid-State-Drive Design with Semiconductor Non-Volatile Memories Koh Johguchi (Chuo Univ.) ICD2013-135 |
Thanks to the recent fabrication technology development, the bit cost of NAND flash memories has been reduced. Thus, sol... [more] |
ICD2013-135 p.83 |
ICD |
2013-04-12 11:10 |
Ibaraki |
Advanced Industrial Science and Technology (AIST) |
[Invited Lecture]
A High Performance Storage Class Memory/MLC NAND Hybrid SSD with Anti-Fragmentation Algorithm Kousuke Miyaji (Chuo Univ.), Hiroki Fujii (Univ. of Tokyo), Koh Johguchi (Chuo Univ.), Kazuhide Higuchi, Chao Sun (Univ. of Tokyo), Ken Takeuchi (Chuo Univ.) ICD2013-15 |
A 3D through-silicon-via (TSV) -integrated hybrid storage class memory (SCM)/multi-level-cell (MLC) NAND solid-state dri... [more] |
ICD2013-15 pp.73-78 |
ICD |
2013-04-12 11:35 |
Ibaraki |
Advanced Industrial Science and Technology (AIST) |
[Invited Lecture]
Design of Vset/reset(3V), Vpgm(20V) generator system for 3D-ReRAM and NAND flash memory hybrid solid-state drives Teruyoshi Hatanaka (Chuo Univ./Univ. of Tokyo), Koh Johguchi, Shogo Hachiya, Ken Takeuchi (Chuo Univ.) ICD2013-16 |
[more] |
ICD2013-16 pp.79-84 |
ICD |
2013-04-12 12:00 |
Ibaraki |
Advanced Industrial Science and Technology (AIST) |
[Invited Lecture]
An Integrated Variable Positive/Negative Temperature Coefficient Read Reference Generator for MLC PCM/NAND Hybrid 3D SSD Kousuke Miyaji, Koh Johguchi (Chuo Univ.), Kazuhide Higuchi (Univ. of Tokyo), Ken Takeuchi (Chuo Univ.) ICD2013-17 |
An integrated variable temperature coefficient (TC) reference generator for multi-level cell phase change memory (PCM)/N... [more] |
ICD2013-17 pp.85-90 |
ICD, IPSJ-ARC |
2013-02-01 11:10 |
Tokyo |
|
Data management algorithm for 3D Hybrid ReRAM/MLC NAND SSD and its performance evaluation Shogo Hachiya, Kousuke Miyaji, Koh Johguchi, Ken Takeuchi (Chuo Univ.) ICD2012-125 |
A 3D Hybrid ReRAM/MLC NAND SSD is proposed. ReRAM is used for storage class memory (SCM). The hybrid SSD realizes 11 tim... [more] |
ICD2012-125 pp.39-43 |
ICD |
2012-12-17 15:55 |
Tokyo |
Tokyo Tech Front |
[Poster Presentation]
Hybrid ReRAM/MLC NAND SSDs with Data Fragmentation Suppression and Evaluation Platform Shun Okamoto, Kousuke Miyaji, Koh Johguchi, Ken Takeuchi (Chuo Univ.) ICD2012-102 |
[more] |
ICD2012-102 p.55 |
ICD |
2012-12-17 15:55 |
Tokyo |
Tokyo Tech Front |
[Poster Presentation]
Evaluation Platform based on Transaction Model Base for 3D Hybrid ReRAM/MLC NAND SSD and Real Data Pattern Analysis Wataru Toriumi, Kousuke Miyaji, Koh Johguchi, Shogo Hachiya, Ken Takeuchi (Chuo Univ.) ICD2012-104 |
[more] |
ICD2012-104 p.59 |
ICD |
2012-12-17 15:55 |
Tokyo |
Tokyo Tech Front |
[Poster Presentation]
Temperature Dependence of Phase Change Random Access Memory (PRAM) Toru Egami, Koh Johguchi, Ken Takeuchi (Chuo Univ) ICD2012-107 |
Phase Change Random Access Memory (PRAM) is considered as one of the most promising candidates for the next generation n... [more] |
ICD2012-107 p.65 |
ICD |
2011-12-15 16:10 |
Osaka |
|
[Poster Presentation]
Endurance enhancement programming method for 50nm resistive random access memory (ReRAM) Kazuhide Higuchi, Kousuke Miyaji, Koh Johguchi, Ken Takeuchi (Univ. of Tokyo) ICD2011-116 |
Resistive memory is the promising candidate for sub-20nm nonvolatile memory owing to low switching current, high scalabi... [more] |
ICD2011-116 pp.75-80 |
ICD |
2011-04-19 14:25 |
Hyogo |
Kobe University Takigawa Memorial Hall |
Design of Program-voltage(20V) Booster and TSV for High Speed and Low Power 3-D Solid State Drive System Teruyoshi Hatanaka, Koh Johguchi, Koichi Ishida, Tadashi Yasufuku, Makoto Takamiya, Takayasu Sakurai, Ken Takeuchi (Univ. of Tokyo) ICD2011-16 |
A design of high speed and low power high-voltage generator system that includes a program-voltage (20V) booster and TSV... [more] |
ICD2011-16 pp.87-92 |
ICD |
2010-12-16 15:10 |
Tokyo |
RCAST, Univ. of Tokyo |
[Poster Presentation]
On-chip immunoassay by a standard CMOS chip Jaesung Lee (Hiroshima Univ.), Koh Johguchi (Univ. of Tokyo), Fumie Kaneko (Astellas), Tomohiro Ishikawa (Hiroshima Univ.) ICD2010-116 |
Aiming an immunoassay application, a standard CMOS chip which actuates dispersed magnetic beads was designed and fabrica... [more] |
ICD2010-116 pp.101-105 |
SDM |
2009-11-12 11:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Compact MOSFET Model and Its Perspective
-- from bulk-MOSFET to MG-MOSFET -- Mitiko Miura-Mattausch, Masataka Miyake, Koh Johguchi, Shunta Kusu, Kenta Ishimura, Hideyuki Kikuchihara, Feldmann Uwe, Mattausch Hans Juergen (Hiroshima Univ.) SDM2009-135 |
[more] |
SDM2009-135 pp.1-6 |
CAS, NLP |
2009-09-25 09:00 |
Hiroshima |
Hiroshima Univ. Higashi Senda Campus |
Analysis of Process Variations by using Ring Oscillator Akihiro Kaya, Koh Johguchi, Hans Juergen Mattausch, Tetsushi Koide (Hiroshima Univ.) CAS2009-36 NLP2009-72 |
Process variations are rapidly increasing as the transistor size is scaled down. Therefore, the negative effects of the ... [more] |
CAS2009-36 NLP2009-72 pp.71-76 |
ICD, SDM |
2007-08-24 16:30 |
Hokkaido |
Kitami Institute of Technology |
A 128-Kbit, 16-Port SRAM Design with Multi-Stage-Sensing Scheme in 90-nm CMOS Technology Koh Johguchi, Yuya Mukuda, Shinya Izumi, Hans Juergen Mattausch, Tetsushi Koide (Hiroshima Univ.) SDM2007-169 ICD2007-97 |
[more] |
SDM2007-169 ICD2007-97 pp.149-154 |