IEICE Technical Committee Submission System
Conference Schedule		 Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 8 of 8  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2025-01-29
14:50		 Tokyo KIT Toranomon Graduate School (Tokyo, Online)
(Primary: On-site, Secondary: Online)		 [Invited Talk] Clarifying the Physical Origin of Long-period Electrical Instability in Silicon Fin-type Quantum Dots
Hiroshi Oka, Hidehiro Asai, Kimihiko Kato, Takumi Inaba, Shunsuke Shitakata, Shota Iizuka, Yusuke Chiashi, Yuika Kobayashi, Hitoshi Yui, Shoko Nagano, Shigenori Murakami, Yoshihisa Iba, Minoru Ogura, Takashi Nakayama, Koike Hanpei, Hiroshi Fuketa (AIST), Satoshi Moriyama (TDU), Takahiro Mori (AIST) SDM2024-68		 (To be available after the conference date) [more] SDM2024-68
pp.11-14
SDM 2024-11-08
10:30		 Tokyo (Tokyo, Online)
(Primary: On-site, Secondary: Online)		 [Invited Talk] Understanding the Cryogenic-CMOS Operation by Milli-Kelvin Temperature Characterization
Hiroshi Oka, Hidehiro Asai, Takumi Inaba, Shunsuke Shitakata, Hitoshi Yui, Hiroshi Fuketa, Shota Iizuka, Kimihiko Kato, Takashi Nakayama, Takahiro Mori (AIST) SDM2024-59		  [more] SDM2024-59
pp.20-21
SDM 2024-11-08
11:20		 Tokyo (Tokyo, Online)
(Primary: On-site, Secondary: Online)		 [Invited Talk] Automation of Cryogenic Device Modeling Utilizing Neural Networks
Takumi Inaba, Yusuke Chiashi, Minoru Ogura, Hidehiro Asai, Hiroshi Fuketa, Hiroshi Oka, Shota Iizuka, Kimihiko Kato, Shunsuke Shitakata, Takahiro Mori (AIST) SDM2024-60		 Automated device model parameter extraction for cryogenic MOSFETs was examined. Transfer learning neural network model w... [more] SDM2024-60
pp.22-25
SDM, ICD, ITE-IST [detail] 2024-08-06
11:00		 Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F (Hokkaido, Online)
(Primary: On-site, Secondary: Online)		 Understanding of Abnormal Vth Increase Induced by Hot Carrier Injection at Cryogenic Temperatures
Shunsuke Shitakata (Keio Univ./AIST), Hiroshi Oka, Kimihiko Kato, Takumi Inaba, Shota Iizuka, Hidehiro Asai, Takahiro Mori (AIST) SDM2024-35 ICD2024-25		 In this study, we attempted to understand the mechanisms of hot carrier degradation in cryogenic MOSFET operation. Hot c... [more] SDM2024-35 ICD2024-25
pp.34-37
SDM 2024-01-31
12:35		 Tokyo KIT Toranomon Graduate School (Tokyo, Online)
(Primary: On-site, Secondary: Online)		 [Invited Talk] Milli-Kelvin Analysis Revealing the Role of Band-edge States in Cryogenic MOSFETs
Hiroshi Oka, Hidehiro Asai, Takumi Inaba, Shunsuke Shitakata, Hitoshi Yui, Hiroshi Fuketa, Shota Iizuka, Kimihiko Kato, Takashi Nakayama, Takahiro Mori (AIST) SDM2023-74		 Toward large-scale quantum computers, cryogenic CMOS circuits have been developed to control and readout the qubits insi... [more] SDM2023-74
pp.1-4
SDM 2023-11-10
13:10		 Tokyo (Tokyo, Online)
(Primary: On-site, Secondary: Online)		 [Invited Talk] Noies Source of MOSFETs Operating at Cryogenic Temperature
Takumi Inaba, Hiroshi Oka, Hidehiro Asai, Hiroshi Fuketa, Shota Iizuka, Kimihiko Kato, Shunsuke Shitakata, Koichi Fukuda, Takahiro Mori (AIST) SDM2023-70		 There is increasing demand for the development of classic integrated circuits to control qubits for quantum computers. F... [more] SDM2023-70
p.35
SDM, ICD, ITE-IST [detail] 2023-08-01
15:25		 Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F (Hokkaido, Online)
(Primary: On-site, Secondary: Online)		 [Invited Talk] Low-Frequency Noise Source in the Cryogenic Operation of Short-Channel Bulk MOSFET
Takumi Inaba, Hiroshi Oka, Hidehiro Asai, Hiroshi Fuketa, Shota Iizuka, Kimihiko Kato, Shunsuke Shitakata, Koichi Fukuda, Takahiro Mori (AIST) SDM2023-40 ICD2023-19		 The assignment of low-frequency noise sources in the cryogenic operation of MOSFET is of great importance because of the... [more] SDM2023-40 ICD2023-19
pp.22-27
SDM, ICD, ITE-IST [detail] 2023-08-01
16:10		 Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F (Hokkaido, Online)
(Primary: On-site, Secondary: Online)		 Additional High-Pressure Hydrogen Annealing Improves the Cryogenic Operation of Si (110)-oriented n-MOSFETs
Shunsuke Shitakata (Keio Univ./AIST), Hiroshi Oka, Takumi Inaba, Shota Iizuka, Kimihiko Kato, Takahiro Mori (AIST) SDM2023-41 ICD2023-20		 Cryo-CMOS technology is highly demanded to realize control circuits of large-scale quantum computers, which control and ... [more] SDM2023-41 ICD2023-20
pp.28-31
 Results 1 - 8 of 8  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan