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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] 2023-11-15
Kumamoto Civic Auditorium Sears Home Yume Hall
(Primary: On-site, Secondary: Online)
Frequency Dependence of Soft Error Rates Induced by Alpha-Particle and Heavy Ion
Haruto Sugisaki, Ryuichi Nakajima, Shotaro Sugitani, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2023-33 ICD2023-41 DC2023-40 RECONF2023-36
 [more] VLD2023-33 ICD2023-41 DC2023-40 RECONF2023-36
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] 2023-11-15
Kumamoto Civic Auditorium Sears Home Yume Hall
(Primary: On-site, Secondary: Online)
Evaluation of SEU Sensitivity by Alpha-Particle on PMOS and NMOS Transistors in a 65 nm bulk Process
Keita Yoshida, Ryuichi Nakajima, Shotaro Sugitani, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2023-35 ICD2023-43 DC2023-42 RECONF2023-38
 [more] VLD2023-35 ICD2023-43 DC2023-42 RECONF2023-38
(Joint) [detail]
Online Online Soft Errors on Flip-flops Depending on Circuit and Layout Structures Estimated by TCAD Simulations
Moeka Kotani, Ryuichi Nakajima (KIT), Kazuya Ioki (ROHM), Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2021-17 ICD2021-27 DC2021-23 RECONF2021-25
We compare the soft error tolerance of conventional flip-flops (FFs) and the proposed radiation-hard FF with small area,... [more] VLD2021-17 ICD2021-27 DC2021-23 RECONF2021-25
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