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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 72  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMD, CPM, OME 2015-06-19
15:55
Tokyo Kikai-Shinko-Kaikan Bldg. By means of a statistical method an analysis of degradation phenomenon of electrical contacts using micro-sliding mechanisms -- A statistical analysis using data of minimal sliding amplitudes under some conditions --
Keiji Koshida, Shin-ichi Wada, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2015-17 CPM2015-27 OME2015-30
Authors have designed and developed a mechanism to be capable of micro-sliding electrical contact directly by using a gi... [more] EMD2015-17 CPM2015-27 OME2015-30
pp.35-40
EMD, R 2015-02-20
15:20
Shizuoka   A method for evaluating degradation phenomenon of electrical contacts using a micro-sliding mechanisms -- Minimal sliding amplitudes against input waveforms under some conditions --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) R2014-73 EMD2014-110
Authors have designed and developed a micro-sliding mechanism (MSM1) which causes electronic devices to oscillate direct... [more] R2014-73 EMD2014-110
pp.13-20
EMD 2014-12-19
14:05
Tokyo Kikai-Shinko-Kaikan Bldg An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (8) -- The effect by application time of external force (3) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-95
Authors, first, analyse the transient response and steady-state one using theoretical inputs developed by Fourier series... [more] EMD2014-95
pp.1-6
EMD 2014-12-19
14:30
Tokyo Kikai-Shinko-Kaikan Bldg Degradation phenomenon of electrical contacts by using a micro-sliding mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (4) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-96
Authors have studied degradation phenomenon on contact resistance under the influences of an external micro-oscillation.... [more] EMD2014-96
pp.7-12
EMD 2014-12-19
14:55
Tokyo Kikai-Shinko-Kaikan Bldg Degradation phenomenon of electrical contacts by using a micro-sliding mechanism and a hammering oscillation mechanism -- The effect of adding quasi-impulsive oscillation to micro-sliding --
Shin-ichi Wada, Hiroki Iwamoto, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-97
Authors have designed and developed a hammering oscillation system which gives transient external-force repeatedly to el... [more] EMD2014-97
pp.13-18
EMD 2014-11-30
14:55
Hokkaido Chitose Cultural Center An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (6) -- The effect by application time of external force --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-91
Authors have studied the degradation phenomenon of electrical contact under the influences of an external micro-oscillat... [more] EMD2014-91
pp.149-154
EMD 2014-11-30
15:15
Hokkaido Chitose Cultural Center Degradation phenomenon of electrical contacts by using a micro-sliding mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (3) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-92
Authors have studied degradation phenomenon on contact resistance under the influences of an external micro-oscillation.... [more] EMD2014-92
pp.155-160
EMD, LQE, OPE, CPM, R 2014-08-22
15:55
Hokkaido Otaru Economy Center An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (PCB) (6) -- The effect by application time of external force --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) R2014-49 EMD2014-54 CPM2014-69 OPE2014-79 LQE2014-53
Authors have obtained the transient response and steady-state one using theoretical inputs developed by Fourier series a... [more] R2014-49 EMD2014-54 CPM2014-69 OPE2014-79 LQE2014-53
pp.133-138
EMD, LQE, OPE, CPM, R 2014-08-22
16:15
Hokkaido Otaru Economy Center Degradation Phenomenon of Electrical Contacts by a Micro-Sliding Mechanism -- The comparison of the evaluated minimal sliding amplitudes --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) R2014-50 EMD2014-55 CPM2014-70 OPE2014-80 LQE2014-54
Authors have developed a mechanism which supplies reciprocal micro-sliding to electrical contacts directly driven by a p... [more] R2014-50 EMD2014-55 CPM2014-70 OPE2014-80 LQE2014-54
pp.139-144
EMD, LQE, OPE, CPM, R 2014-08-22
16:35
Hokkaido Otaru Economy Center Degradation phenomenon of electrical contacts by a micro-sliding mechanism -- The comparison of the evaluated minimal sliding amplitudes under some conditions (2) --
Keiji Koshida, Shin-ichi Wada, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) R2014-51 EMD2014-56 CPM2014-71 OPE2014-81 LQE2014-55
Authors have developed a hammering oscillating mechanism which gives micro-oscillation to electrical
contacts, and have... [more]
R2014-51 EMD2014-56 CPM2014-71 OPE2014-81 LQE2014-55
pp.145-150
OME, EMD, CPM 2014-06-20
11:20
Tokyo Kikai-Shinko-Kaikan Bldg. An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (5) -- Natural Frequency and Damping Ratio(2) --
Keiji Koshida, Shin-ichi Wada, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-14 CPM2014-34 OME2014-22
Authors have obtained the steady-state responses using theoretical inputs developed by Fourier series and the analytical... [more] EMD2014-14 CPM2014-34 OME2014-22
pp.33-38
NLP 2014-03-10
16:10
Tokyo Sophia University Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- Modeling about Fluctuation of Contact Resistance (5) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) NLP2013-176
Authors have developed some mechanisms which give real vibration to electrical contacts and have studied the influences ... [more] NLP2013-176
pp.67-72
EMD 2014-01-31
13:35
Tokyo   An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board(4) -- Natural Frequency and Damping Ratio --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2013-136
Authors have obtained the steady-state responses using theoretical inputs developed by Fourier series and the analytical... [more] EMD2013-136
pp.1-6
EMD 2013-12-20
14:55
Tokyo Kikai-Shinko-Kaikan Bldg. An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (3) -- Properties of the Responses using Rectangular Wave & Sinusoidal one as Input --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2013-133
Authors have designed and developed the mechanism which gives vibration to electrical contacts by transient force using ... [more] EMD2013-133
pp.11-16
EMD 2013-11-16
09:30
Overseas Huazhong University of Science and Technology, Wuhan, P.R.China An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board -- Properties of the Responses using Rectangular Wave and Sinusoidal one as an Input --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2013-78
Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertic... [more] EMD2013-78
pp.15-18
EMD 2013-11-16
09:45
Overseas Huazhong University of Science and Technology, Wuhan, P.R.China An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board -- Natural Frequency and Damping Ratio (2) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2013-79
Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertic... [more] EMD2013-79
pp.19-22
EMCJ, EMD 2013-07-12
10:35
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation Phenomenon of Electrical Contacts using a Hammering Oscillation Mechanism or a Micro-Sliding Mechanism -- A fundamental study on the performance of the hammering oscillation mechanism (28) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2013-39 EMD2013-24
Authors have studied the effect on electrical contacts by actual micro-oscillation using the hammering oscillation mecha... [more] EMCJ2013-39 EMD2013-24
pp.1-6
EMD, CPM, OME 2013-06-21
14:40
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation Phenomenon of Electrical Contacts by using a Hammering Oscillating Mechanism or a Micro-Sliding Mechanism -- A fundamental study on the performance of the hammering oscillating mechanism (27) --
Shin-ichi Wada, Keiji Koshida, Naoki Masuda, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2013-17 CPM2013-32 OME2013-40
Authors have studied the influence on electrical contacts by actual micro-oscillation using some oscillating mechanisms ... [more] EMD2013-17 CPM2013-32 OME2013-40
pp.55-60
NLP 2013-04-25
10:25
Aichi Nagoya campus, Chukyo University Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- Modeling about Fluctuation of Contact Resistance (4) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) NLP2013-2
Authors have developed some mechanisms which give real vibration to electrical contacts and have studied the influences ... [more] NLP2013-2
pp.7-12
NLP 2013-03-14
13:50
Chiba Nishi-Chiba campus, Chiba Univ. Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- Modeling about Fluctuation of Contact Resistance (3) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Thech.) NLP2012-152
Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a ... [more] NLP2012-152
pp.43-48
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