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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] |
2023-11-16 14:10 |
Kumamoto |
Civic Auditorium Sears Home Yume Hall (Primary: On-site, Secondary: Online) |
Implementation of Neural Networks in Memory-based Reconfigurable Processor Kenta Sasagawa, Tatsuya Nishikawa, Xihong Zhou, Senling Wang, Hiroshi Kai, Hiroshi Takahashi (Ehime Univ.) VLD2023-51 ICD2023-59 DC2023-58 RECONF2023-54 |
With the development of recent IoT technologies,there is a demand to implement intelligent processing in devices where d... [more] |
VLD2023-51 ICD2023-59 DC2023-58 RECONF2023-54 pp.112-116 |
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] |
2023-11-16 16:45 |
Kumamoto |
Civic Auditorium Sears Home Yume Hall (Primary: On-site, Secondary: Online) |
Implementation Evaluation of a Memorism Pattern Matching Accelerator on FPGA Shion Honda, Tatsuya Nishikawa, Xihong Zhou, Senling Wang, Hiroshi Kai, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Katsumi Inoue (AOT) VLD2023-61 ICD2023-69 DC2023-68 RECONF2023-64 |
[more] |
VLD2023-61 ICD2023-69 DC2023-68 RECONF2023-64 pp.162-167 |
DC |
2020-02-26 11:35 |
Tokyo |
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Method for Inserting Fault-Detection-Strengthened Test Point under Multi-cycle Testing Tomoki Aono, Norihiro Nakaoka, Shyu Saikou, Wang Senling, Higami Yoshinobu, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Youichi Maeda, Jun Matsushima (Renesas) DC2019-89 |
For guaranteeing the functional safety of an in-vehicle system, a power-on self-test (POST) is required to test the devi... [more] |
DC2019-89 pp.19-24 |
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