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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD |
2013-03-06 15:35 |
Okinawa |
Okinawa Seinen Kaikan |
Robust Redundant Circuit Structure to Mitigate Wearout by Reversing Register Values Shogo Okada, Masaki Masuda (Kyoto Inst. of Tech.), Jun Yao, Hajime Shimada (NAIST), Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2012-162 |
[more] |
VLD2012-162 pp.147-152 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-28 13:25 |
Miyazaki |
NewWelCity Miyazaki |
Performance Evaluation of Soft-Error Tolerant Multiple Modular Processors Implemented with Redundant and Non-Redundant Flip-Flops Shogo Okada, Masaki Masuda (KIT), Jun Yao, Hajime Shimada (NAIST), Kazutoshi Kobayashi (KIT) VLD2011-59 DC2011-35 |
Soft-error rates are becoming larger due to process scaling. Various ways of prediction for soft-error
are being tried.... [more] |
VLD2011-59 DC2011-35 pp.43-48 |
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