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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 11 of 11  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, HWS, ICD 2024-03-01
11:15		 Okinawa
(Primary: On-site, Secondary: Online)		 Investigation of electromagnetic irradiation noise reduction by on-chip LDOs
Rikuu Hasegawa, Kazuki Monta, Takuya Wadatsumi, Takuji Miki, Makoto Nagata (Kobe Univ.) VLD2023-124 HWS2023-84 ICD2023-113		 IC chips are subject to the threat of fault injection attacks, which cause circuit malfunctions (faults) by injecting il... [more] VLD2023-124 HWS2023-84 ICD2023-113
pp.131-134
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] 2023-11-17
09:35		 Kumamoto Civic Auditorium Sears Home Yume Hall
(Primary: On-site, Secondary: Online)		 Backside Side-Channel Attack by Silicon Substrate Voltage and Simulation
Rikuu Hasegawa, Kazuki Monta, Takuya Watatsumi, Takuji Miki, Makoto Nagata (Kobe Univ) VLD2023-63 ICD2023-71 DC2023-70 RECONF2023-66		 Integrated circuit (IC) chips equipped with cryptographic circuits are vulnerable to side-channel attacks, which use exp... [more] VLD2023-63 ICD2023-71 DC2023-70 RECONF2023-66
pp.173-177
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] 2023-11-17
10:00		 Kumamoto Civic Auditorium Sears Home Yume Hall
(Primary: On-site, Secondary: Online)		 Derivation of secret keys by differential fault analysis using backside voltage fault injection
Yusuke Hayashi, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) VLD2023-64 ICD2023-72 DC2023-71 RECONF2023-67		 Lasers have been the leading method of fault injection in fault injection attacks on cryptographic integrated circuit (I... [more] VLD2023-64 ICD2023-72 DC2023-71 RECONF2023-67
pp.178-181
HWS 2023-04-14
14:45		 Oita
(Primary: On-site, Secondary: Online)		 Exploration of analysis methods of electromagnetic fault injection attacks on cryptographic IC chips
Yusuke Hayashi, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2023-4		 There are various methods of fault injection attacks on cryptographic IC chips, such as lasers and electromagnetic waves... [more] HWS2023-4
pp.11-15
HWS 2023-04-14
15:10		 Oita
(Primary: On-site, Secondary: Online)		 Electromagnetic fault injection attacks on cryptographic IC chips and analysis of internal voltage fluctuation
Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ) HWS2023-5		 Cryptographic IC chips are subject to the threat of fault injection attacks, which cause circuit malfunctions through in... [more] HWS2023-5
pp.16-19
HWS, ICD 2022-10-25
10:50		 Shiga
(Primary: On-site, Secondary: Online)		 Power current simulation and side channel leakage evaluation of cryptographic IC chips
Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2022-32 ICD2022-24		 Cryptographic modules are threatened by side-channel attacks that use side-channel information to decrypt internal confi... [more] HWS2022-32 ICD2022-24
pp.12-16
ICD, SDM, ITE-IST [detail] 2022-08-08
15:20		 Online   Evaluation of IC Chip Response by Backside Voltage Disturbance in Flip Chip Packaging
Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa (Kobe Univ.), Kikuo Muramatsu (e-SYNC), Hiromu Hasegawa, Takuya Sawada, Takahito Fukushima, Hisashi Kondo (Megachips), Takuji Miki, Makoto Nagata (Kobe Univ.) SDM2022-40 ICD2022-8		 Flip chip packaging has become a general technique for mounting semiconductor ICs due to the need for smaller area. Howe... [more] SDM2022-40 ICD2022-8
pp.27-30
EMCJ 2022-06-10
11:00		 Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)		 Evaluation of External Disturbance Immunity by Bulk Current Injection into Ethernet Communication System(2)
Kohei Kawai, Takuya Wadatsumi (Kobe Univ.), Ken Okamoto, Yuichiro Okugawa (NTT), Takuji Miki, Makoto Nagata (Kobe Univ.) EMCJ2022-18		  [more] EMCJ2022-18
pp.21-25
EMCJ 2022-01-21
11:20		 Online Online Evaluation of External Disturbance Immunity by Bulk Current Injection into Ethernet Communication System
Kohai Kawai, Takuya Wadatsumi, Akira Tsukada (Kobe Univ.), Ken Okamoto, Yuichiro Okugawa (NTT), Takuji Miki, Makoto Nagata (Kobe Univ.) EMCJ2021-64		 We developed a model of communication failures caused by external disturbances in Ethernet and collected experimental da... [more] EMCJ2021-64
pp.18-22
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]		 2021-12-01
14:20		 Online Online A Dual-mode SAR ADC to Detect Power Analysis Attack
Takuya Wadatsumi, Takuji Miki, Makoto Nagata (Kobe Univ.) VLD2021-30 ICD2021-40 DC2021-36 RECONF2021-38		 Distributed IoT devices are exposed to unexpected interferences by physical accesses by malicious attackers. An on-chip ... [more] VLD2021-30 ICD2021-40 DC2021-36 RECONF2021-38
pp.78-82
ICD
(2nd)		 2021-03-01
13:40		 Online Online Response evaluation and in-situ detection of electromagnetic disturbance using on-chip monitor
Takuya Wadatsumi, Takuji Miki, Makoto Nagata (Kobe Univ.) 		 [more]
 Results 1 - 11 of 11  /   
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