IEICE Technical Committee Submission System
Conference Schedule		 Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 5 of 5  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SIP, MI, IE 2019-05-23
13:25		 Aichi   OCT Volumetric Data Restoration with 3-D Non-separable Oversampled Lapped Transforms
Yuta Yoshida, Genki fujii (Graduate School of Science and Tech., Niigata Univ.), Shogo Muramatsu, Samuel Choi (Niigata Univ.), Shunsuke Ono (Tokyo Institute of Tech.), Takeru Ota, Fumiaki Nin, Hiroshi Hibino (Niigata Univ.) SIP2019-2 IE2019-2 MI2019-2		  [more] SIP2019-2 IE2019-2 MI2019-2
pp.7-12
SIP 2018-08-20
14:25		 Tokyo Takushoku Univ. Bunkyo Campus. Experiment on OCT Volumetric Data Restoration via Hierarchical Sparsity and Hard Constraint
Genki Fujii, Shogo Muramatsu, Samuel Choi (Niigata Univ.), Shunsuke Ono (Tokyo Tech.), Takeru Ota, Fumiaki Nin, Hiroshi Hibino (Niigata Univ.) SIP2018-58		 In this report, we try to apply the restoration algorithm proposed in [1] to real observation data acquired byoptical co... [more] SIP2018-58
pp.7-12
PRMU, MI, IE, SIP 2018-05-17
15:15		 Gifu   On OCT Volumetric Data Restoration via Hierarchical Sparsity and Hard Constraint
Shogo Muramatsu, Satoshi Nagayama, Samuel Choi (Niigata Univ.), Shunsuke Ono (Tokyo Institute of Tech.), Takeru Ota, Fumiaki Nin, Hiroshi Hibino (Niigata Univ.) SIP2018-3 IE2018-3 PRMU2018-3 MI2018-3		 This work proposes a novel restoration method for optical coherence tomography (OCT) data. OCT is a measurement techniqu... [more] SIP2018-3 IE2018-3 PRMU2018-3 MI2018-3
pp.7-12
SDM 2011-07-04
09:20		 Aichi VBL, Nagoya Univ. Structure and formation of epitaxial graphene on SiC(0001)
Hiroyuki Kageshima, Hiroki Hibino, Hiroshi Yamaguchi (NTT Basic Research Labs.), Masao Nagase (Univ. Tokushima) SDM2011-51		 Epitaxial graphene growth on SiC(0001) surface is theoretically studied by the first-principles calculation. It is found... [more] SDM2011-51
pp.7-10
SDM, ED 2009-06-24
14:00		 Overseas Haeundae Grand Hotel, Busan, Korea [Invited Talk] Metrology of microscopic properties of graphene on SiC
Masao Nagase, Hiroki Hibino, Hiroyuki Kageshima, Hiroshi Yamaguchi (NTT BRL) ED2009-61 SDM2009-56		 Graphene has recently attracted a lot of research interest because of its superior electric properties. Thermally grown ... [more] ED2009-61 SDM2009-56
pp.47-52
 Results 1 - 5 of 5  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan