|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM |
2010-12-17 14:50 |
Kyoto |
Kyoto Univ. (Katsura) |
Properties of the oxidized layers on SiC in supercritical water Tomohisa Satoh (Osaka Univ.), Takashi Futatsuki, Taro Oe (Organo), Naoyoshi Komatsu, Chiharu Kimura, Hidemitsu Aoki (Osaka Univ.) SDM2010-196 |
[more] |
SDM2010-196 pp.63-67 |
ED |
2010-06-18 11:50 |
Ishikawa |
JAIST |
Photo corrosion of Metal Gate Electrodes during Wet Daisuke Watanabe (Daikin Industries,Ltd.), Chiharu Kimura, Hidemitsu Aoki (Osaka Univ.) ED2010-46 |
Wet processes for removing high-k film involve the risk of enhanced galvanic corrosion at the gate electrode level. We f... [more] |
ED2010-46 pp.69-74 |
ED |
2010-06-18 12:15 |
Ishikawa |
JAIST |
Methyl-BCN Film using Low Temperature Etching. Hidemitsu Aoki, Makoto Hara, Takuro Masuzumi, Zhiming Lu, Tomohiro Kuki, Chiharu Kimura, Takashi Sugino (Osaka Univ.) ED2010-47 |
[more] |
ED2010-47 pp.75-80 |
ED |
2009-07-30 14:25 |
Osaka |
Osaka Univ. Icho-Kaikan |
Sensing of organic acid using ion exchange fiber film Masanori Ohnishi, Saori Hotta, Hidemitsu Aoki, Takeshi Ohmi (Osaka Univ.), Kazuhiro Kumeta, Yasuto Hata (Nitivy Corp.), Chiharu Kimura, Takashi Sugino (Osaka Univ.) ED2009-104 |
In recent years, environmental pollution and health control problems have been focused intensively. A simple and inexpen... [more] |
ED2009-104 pp.13-18 |
ED |
2009-07-31 11:40 |
Osaka |
Osaka Univ. Icho-Kaikan |
Process technology of MEMS microscale-coil structure for energy harvesting with Cu electroplating adding magnetic fields Naoki Ooi, Hidemitsu Aoki, Eitaro Kubo, Jong-Hyeon Jeong, Chiharu Kimura, Takashi Sugino (Osaka Univ.) ED2009-112 |
[more] |
ED2009-112 pp.51-55 |
ED |
2009-06-11 13:25 |
Tokyo |
|
Evaluation of Cu-Inhibitor Residue for Post Cu-CMP Cleaning Atsushi Ito, Ken Harada, Yasuhiro Kawase, Fumikazu Mizutani (Mitsubishi Chem.), Makoto Hara, Hidemitsu Aoki, Chiharu Kimura, Takashi Sugino (Osaka Univ.) ED2009-36 |
[more] |
ED2009-36 pp.1-6 |
ED |
2008-06-13 14:15 |
Ishikawa |
Kanazawa University |
Characterization of N-doped AlSiO film for wide bandgap semiconductors Naoyoshi Komatsu, Hirotaka Tanaka, Hidemitsu Aoki, Keiko Matsunouchi, Chiharu Kimura (Osaka Univ.), Yukihiko Okumura (Maizuru National Col. of Tech.), Takashi Sugino (Osaka Univ.) ED2008-25 |
A gate insulator film with a wide bandgap and a high dielectric constant is required to achieve high power field effect ... [more] |
ED2008-25 pp.17-22 |
SDM, R, ED |
2007-11-16 13:00 |
Osaka |
|
Electrical Characterization of Yttriumaluminate(YAlO)Film Keiko Matsunouchi, Naoyoshi Komatsu, Chiharu Kimura, Hidemitsu Aoki, Takashi Sugino (Osaka Univ.) R2007-46 ED2007-179 SDM2007-214 |
To achieve high power FET using wide bandgap semiconductor, a gate insulator film with a wide bandgap and a high dielect... [more] |
R2007-46 ED2007-179 SDM2007-214 pp.1-6 |
SDM, R, ED |
2007-11-16 13:25 |
Osaka |
|
Galvanic Corrosion Suppression of High-k/Metal Gates Daisuke Watanabe, Hidemitsu Aoki, Saori Hotta, Chiharu Kimura, Takashi Sugino (Osaka Univ) R2007-47 ED2007-180 SDM2007-215 |
[more] |
R2007-47 ED2007-180 SDM2007-215 pp.7-11 |
SDM, R, ED |
2007-11-16 13:50 |
Osaka |
|
Oxidation of SiC and GaN Surface in High Pressure and High Temperature Water Takashi Futatsuki, Taro Oe (Organo Corp.), Hidemitsu Aoki, Naoyoshi Komatsu, Chiharu Kimura, Takashi Sugino (Osaka Univ.) R2007-48 ED2007-181 SDM2007-216 |
The field effect transistor (FET) devices on Silicon Carbide (SiC) and Gallium nitride (GaN), which have a wide bandgap,... [more] |
R2007-48 ED2007-181 SDM2007-216 pp.13-17 |
ED, OME |
2007-09-21 15:25 |
Fukuoka |
Kyushu Institute of Technology |
Biological material sensing using a porous ion exchange film with monolith structure Saori Hotta, Kazuki Miyano, Hidemitsu Aoki (Osaka Univ.), Nobuaki Fujiwara, Akihiko Masui (TRI of Osaka), Daisaku Yano, Kazuhiko Sano, Koji Yamanaka (Organo), Chiharu Kimura, Takashi Sugino (Osaka Univ.) ED2007-153 OME2007-40 |
[more] |
ED2007-153 OME2007-40 pp.47-52 |
ED |
2007-08-03 17:00 |
Osaka |
|
Field emission characteristics of carbon nanotube coated with boron carbon nitride film Chiharu Kimura, Makoto Yukawa, Hidemitsu Aoki (Osaka Univ.), Yuichi Horikawa, Katsuo Takizawa (Horizon), Takashi Sugino (Osaka Univ.) ED2007-143 |
Field emission characteristics of carbon nanotube (CNT) coated with the boron carbon nitride (BCN) films are investigate... [more] |
ED2007-143 pp.37-41 |
OME, ED |
2006-09-08 14:40 |
Fukuoka |
Kyushu Institute of Technology |
Characterization of ion sensing using a porous ion exchange film with monolith structure Hidemitsu Aoki, Kazuki Miyano, Chiharu Kimura, Takashi Sugino (Osaka Univ.) |
[more] |
|
ED |
2006-08-03 14:40 |
Osaka |
Osaka Univ. Convention Center |
Field emission characteristics of carbon nanotube emitter coated with boron nitride Yuji Morihisa, Takumi Kobayashi, Shigeki Hayashi (Shimadzu Corporation), Seiji Akita, Yoshikazu Nakayama (Osaka Prefecture Univ.), Makoto Yukawa, Chiharu Kimura, Hidemitsu Aoki, Takashi Sugino (Osaka Univ.) |
[more] |
ED2006-121 pp.21-26 |
ED |
2005-12-22 12:45 |
Tokyo |
|
- Chiharu Kimura, Kunitaka Okada (Osaka Univ.), , (Maizuru National College of Tech.), Hidemitsu Aoki, Takashi Sugino (Osaka Univ.) |
Field emission characteristics of the boron carbon nitride (BCN) films deposited on the iron substrate at various temper... [more] |
ED2005-182 pp.1-6 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|