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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 8 of 8  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
HCGSYMPO
(2nd)
2017-12-13
- 2017-12-15
Ishikawa THE KANAZAWA THEATRE Examination for systematization of pacemaker troubleshooting
Kazuya Murakami (BSJ), Yasuhiro Kawahara (OUJ)
Pacemaker troubleshooting is discussed in case studies or review articles. However, clinical decision support system (CD... [more]
EMD, R 2017-02-17
17:00
Shiga Omuron Kusatsu Factory Report on thermal simulation technique to analyze effect of contact bounce arc.
Kazua Murakami, Takeshi Nishida (Omron), Tetsuo Shinkai (OER) R2016-71 EMD2016-98
We report a thermal analysis method to quantify the melting phenomenon of the contact which causes the contact welding p... [more] R2016-71 EMD2016-98
pp.65-70
R 2015-06-19
14:50
Tokyo   A Study of Short-time Evaluation Method for Aluminum Electrolytic Capacitor
Yuichi Sumimoto, Kazuya Murakami, Kenji Adachi (Toshiba) R2015-13
By using quality engineering, we developed a technique to evaluate aluminum electrolytic capacitor in a shorter time tha... [more] R2015-13
pp.19-24
R 2013-06-14
13:30
Tokyo   Degradation diagnosis of LED by junction temperature shift
Yuichi Sumimoto, Kazuya Murakami, Kenji Adachi (Toshiba) R2013-16
LEDs are used of lighting and sensor in recent industrial equipment. LEDs are energy saving and longevity of lightning, ... [more] R2013-16
pp.1-6
MVE, ITE-HI, HI-SIG-VR 2012-06-27
15:50
Tokyo Sanjo Conference Hall Wearable Augmented Reality System with Haptic Feedback
Kazuya Murakami, Ryo Kiyama, Jun Imura, Takuji Narumi, Tomohiro Tanikawa, Michitaka Hirose (The Univ. of Tokyo) MVE2012-27
In the reasearch field of augmented reality(AR), not only study to superimpose virtual objects but also study to achieve... [more] MVE2012-27
pp.119-124
R 2012-06-15
13:15
Tokyo   Study on Prevention of Trouble by Structure Analysis of LSI -- The efforts for the reliability improvement of the electronic components for power plant --
Kazuya Murakami, Yuichi Sumimoto (Toshiba) R2012-11
Electronic components to be applied to industrial products, it is necessary to be highly reliable. However, since the hi... [more] R2012-11
pp.1-5
R 2011-06-17
14:50
Tokyo   THERMAL EFFUSIVITY MEASURMENT OF MULTILAYER PLATING USING THERMAL MICROSCOPE
Kazuya Murakami, Kunihiko Wada (Toshiba) R2011-18
On a non-defective analysis of electronic components, people use X-ray transmission inspection and infrared thermography... [more] R2011-18
pp.17-21
R 2009-06-19
13:25
Tokyo Kikai-Shinko-Kaikan Bldg. Consideration of short-term test method for Aluminum Electrolytic Capacitor
Kazuya Murakami, Kenji Adachi (Toshiba Corp.) R2009-18
In recent years, the durability of aluminum electrolytic capacitors improved, and the one to have long life increased. I... [more] R2009-18
pp.7-11
 Results 1 - 8 of 8  /   
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