Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMD, CPM, OME |
2013-06-21 14:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Degradation Phenomenon of Electrical Contacts by using a Hammering Oscillating Mechanism or a Micro-Sliding Mechanism
-- A fundamental study on the performance of the hammering oscillating mechanism (27) -- Shin-ichi Wada, Keiji Koshida, Naoki Masuda, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2013-17 CPM2013-32 OME2013-40 |
Authors have studied the influence on electrical contacts by actual micro-oscillation using some oscillating mechanisms ... [more] |
EMD2013-17 CPM2013-32 OME2013-40 pp.55-60 |
EMD |
2013-01-25 15:25 |
Kanagawa |
Hitachi, Ltd., (Totsuka, Yokohama) |
Degradation Phenomenon of Electrical Contacts by using Micro-Sliding Mechanisms
-- Anallysis of Time-Sequential Fluctuation Data (27) -- Shin-ichi Wada, Keiji Koshida (TMC), Shoko Nagai (Keio), Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-99 |
Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a ... [more] |
EMD2012-99 pp.9-14 |
EMD |
2012-12-21 15:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Degradation Phenomenon of Electrical Contacts using hammering oscillating mechanism and micro-sliding mechanism
-- A fundamental study on the performance of the hammering oscillating mechanism (26) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling (TMC), Naoki Masuda (TCT), Kunio Yanagi, Hiroaki Kubota (TMC), Masashi Terasaki (TCT), Koichiro Sawa (NIT) EMD2012-95 |
Authors have studied the influence on electrical contacts by actual micro-oscillation using some oscillating mechanisms ... [more] |
EMD2012-95 pp.27-32 |
EMD |
2012-12-01 14:30 |
Chiba |
Chiba Institute of Technology |
Degradation phenomenon of electrical contacts using a hammering oscillating mechanism
-- A fundamental study on the performance of the oscillating mechanism (25) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2012-86 |
Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertic... [more] |
EMD2012-86 pp.125-131 |
EMCJ, EMD |
2012-07-20 12:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism
-- A fundamental study on the performance of the oscillating mechanism (23) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Kouki Takeda, Naoki Masuda, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2012-41 EMD2012-16 |
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] |
EMCJ2012-41 EMD2012-16 pp.1-6 |
EMCJ, EMD |
2012-07-20 13:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Degradation Phenomenon of Electrical Contacts using some Oscillating Mechanisms
-- Modeling about Fluctuation of Contact Resistance (24) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2012-42 EMD2012-17 |
Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a ... [more] |
EMCJ2012-42 EMD2012-17 pp.7-12 |
EMD, CPM, OME |
2012-06-22 17:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism
-- A fundamental study on the performance of the oscillating mechanism(22) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-15 CPM2012-32 OME2012-39 |
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] |
EMD2012-15 CPM2012-32 OME2012-39 pp.41-46 |
EMD |
2012-05-25 14:20 |
Miyagi |
Tohoku Bunka Gakuen Univ. |
Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism
-- Contact Resistance and its Model (21) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-3 |
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] |
EMD2012-3 pp.13-18 |
EMD |
2012-01-20 13:35 |
Kanagawa |
|
Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism
-- Contact Resistance and its model (20) -- Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-112 |
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] |
EMD2011-112 pp.1-6 |
EMD |
2011-11-18 16:15 |
Akita |
Akita Univ. Tegata Campus |
Degradation Phenomenon of Electrical Contacts using a Micro-Sliding Mechanism
-- Minimal Sliding Amplitudes estimated under some conditions by the Mechanism (18) -- Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2011-102 |
Authors have developed the mechanism which gives damping vibration to electrical contacts by the reciprocal hammering-os... [more] |
EMD2011-102 pp.189-194 |
EMD |
2011-10-21 12:35 |
Tokyo |
Tachikawa-Shiminn-kaikan |
Degradation Phenomenon of Electrical Contacts by hammering Oscillating mechanism and micro-sliding mechanism
-- Contact Resistance (17) -- Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-57 |
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] |
EMD2011-57 pp.1-6 |
EMD, EMCJ |
2011-07-15 12:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Degradation phenomenon of electrical contacts by hammering oscillating mechanism and micro-sliding mechanism
-- Contact resistance (16) -- Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2011-61 EMD2011-20 |
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] |
EMCJ2011-61 EMD2011-20 pp.1-6 |
EMD, EMCJ |
2011-07-15 12:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Degradation Phenomenon of Electrical Contacts by a Tapping Device
-- A tapping device for trial (3) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Koki Takeda, Daiki Ishizuka, Kunio Yanagi, Hiroaki Kubota (TMC), Nobuhiro Kuga (YNU), Koichiro Sawa (NIT) EMCJ2011-62 EMD2011-21 |
Authors have developed and made a handy “tapping device (TPD)” experimentally without a special stage for the inspection... [more] |
EMCJ2011-62 EMD2011-21 pp.7-12 |
EMD |
2011-01-28 15:40 |
Tokyo |
Japan Aviation Electronics Industry,Limited |
Degradation phenomenon of electrical contacts by a tapping device
-- A tapping device for trial (1) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Daiki Ishizuka, Kunio Yanagi, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT) EMD2010-141 |
Authors have studied the influence on electrical contact resistance by external micro-oscillation using a hammering osci... [more] |
EMD2010-141 pp.35-40 |