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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 8 of 8  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2022-11-11
09:30
Online Online [Invited Talk] Toward Super Temporal Resolution by Suppression of Mixing Effects of Electrons
Takeharu Goji Etoh (Osaka Univ.), Kazuhiro Shimonomura, Taeko Ando, Yoshiyuki Matsunaga, Yutaka Hirose (Ritsumeikan Univ.), Takayoshi Shimura, Heiji Watanabe (Osaka Univ.), Yoshinari Kamakura (OIT), Hideki Mutoh (Link Research) SDM2022-71
The theoretical temporal resolution limit of silicon (Si) image sensors is 11.1 ps. The super temporal resolution (STR) ... [more] SDM2022-71
pp.32-39
SDM 2015-11-05
11:25
Tokyo Kikai-Shinko-Kaikan Bldg. Analysis of Ultra-High-Speed Image Sensor with Monte Carlo Simulation
Natsumi Minamitani (Osaka Univ.), Vu Truon Son Dao, Kazuhiro Shimonomura, Takeharu Goji Etoh (Ritsumeikan Univ.), Yoshinari Kamakura, Nobuya Mori (Osaka Univ.) SDM2015-86
We computationally investigate the fundamental properties of electron transport in the backside-illuminated CCD image se... [more] SDM2015-86
pp.13-17
BioX, ITE-ME, ITE-IST 2015-06-29
11:00
Ishikawa Kanazawa University, Kakuma Campus A pico-second burst imaging camera
Takeharu G. Etoh (Ritsmeikan Univ.), Hiroyuki Shiraga (Osaka Univ.)
 [more]
ICD, ITE-IST 2014-07-03
13:30
Shimane Izumo-shi (Shimane) Analysis of ultra-fast image sensor with Monte Carlo device simulation technique
Yoshinari Kamakura (Osaka Univ.), Kazuhiro Shimonomura, Takeharu G. Etoh (Ritsumeikan Univ.) ICD2014-23
 [more] ICD2014-23
pp.23-27
SIP, CAS, VLD 2009-07-02
13:50
Hokkaido Kushiko-shi Shogai Gakushu Center Measured Data Evaluations for Both Behaviors of MOSFET and Lateral BJT Based on High Breakdown Voltage SOI-CMOS Process using Asymmetric LDD structure
Takashi Hamahata (Kinki Univ.), Toshiaki Koike-Akino (Harvard Univ.), Toshiro Akino, T. Goji Etoh (Kinki Univ.) CAS2009-19 VLD2009-24 SIP2009-36
This paper describes that, being based on 0.6um SOI-CMOS process of X-FAB having an MOSFET structure with a high breakdo... [more] CAS2009-19 VLD2009-24 SIP2009-36
pp.103-108
VLD, CAS, SIP 2008-06-26
15:25
Hokkaido Hokkaido Univ. Power Supply Chip for CCD in Ultra-High-Speed Camera Based on 1.2um CMOS/SOI Process with High Breakdown Voltage
Masatoshi Kobayashi, Toshiro Akino (Kinki Univ.), Kenji Nishi (Kinki Univ. Tech. of Collage), Kousei Takehara, Takeharu Etoh (Kinki Univ.) CAS2008-15 VLD2008-28 SIP2008-49
 [more] CAS2008-15 VLD2008-28 SIP2008-49
pp.81-86
VLD, CAS, SIP 2008-06-26
15:45
Hokkaido Hokkaido Univ. A Lateral Unified-CBiCMOS Buffer Circuit for High Speed and Low Energy Based on 0.18μm CMOS/SOI Process
Takashi Hamahata, Satoshi Uto, Toshiro Akino (Kinki Univ.), Kenji Nishi (Kinki Univ. Tech of Collage), Kousei Takehara, Takeharu Etoh (Kinki Univ.) CAS2008-16 VLD2008-29 SIP2008-50
In this paper, we develop a printed circuit board having a discrete device that can drive a CCD chip with 5 nF maximum l... [more] CAS2008-16 VLD2008-29 SIP2008-50
pp.87-92
CAS, SIP, VLD 2007-06-22
10:30
Hokkaido Hokkaido Tokai Univ. (Sapporo) A Lateral Unified-CBiCMOS Buffer Circuit for Driving 5nF Maximum Load Capacitance per CCD Clock
Masatoshi Kobayashi, Takashi Hamahata, Toshiro Akino, Kenji Nishi, Cuong Vo Le, Kousei Takehara, T. Goji Etoh (Kinki Univ.) CAS2007-22 VLD2007-38 SIP2007-52
Since 2001, we have been developing an in-situ storage image sensor (ISIS) that captures 100 to 150 consecutive images a... [more] CAS2007-22 VLD2007-38 SIP2007-52
pp.19-24
 Results 1 - 8 of 8  /   
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