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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ED |
2011-07-29 14:45 |
Niigata |
Multimedia system center, Nagaoka Univ. of Tech. |
Characterization of MOS interfaces and current collapse in AlGaN/GaN HEMTs Tamotsu Hashizume, Chihoko Mizue, Yujin Hori, Masafumi Tajima, Kota Ohi (Hokkaido Univ.) ED2011-40 |
[more] |
ED2011-40 pp.17-20 |
MW, ED |
2011-01-14 09:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Current collapse characterization of AlGaN/GaN HEMTs using by dual-gate structure Masafumi Tajima, Tamotsu Hashizume (Hokkaido Univ.) ED2010-182 MW2010-142 |
By using a dual-gate structure, we have investigated impact of gate-stress position on the current collapse behavior of ... [more] |
ED2010-182 MW2010-142 pp.41-44 |
ED, CPM, SDM |
2009-05-15 13:50 |
Aichi |
Satellite Office, Toyohashi Univ. of Technology |
Operation stability assessment of AlGaN/GaN HEMT Masafumi Tajima, Tamotsu Hashizume (Hokkaido Univ.) ED2009-34 CPM2009-24 SDM2009-24 |
[more] |
ED2009-34 CPM2009-24 SDM2009-24 pp.87-90 |
ED |
2008-06-13 13:50 |
Ishikawa |
Kanazawa University |
Deep levels in AlGaN and operation stability of AlGaN/GaN HEMT Masafumi Tajima, Junji Kotani, Katsuya Sugawara, Tamotsu Hashizume (Hokkaido Univ.) ED2008-24 |
[more] |
ED2008-24 pp.11-16 |
CPM, ED, LQE |
2007-10-12 11:15 |
Fukui |
Fukui Univ. |
Surface control of AlGaN/GaN strcutures Masafumi Tajima, Junji Kotani, Takahiro Tamura, Tamotsu Hashizume (Hokkaido Univ.) ED2007-170 CPM2007-96 LQE2007-71 |
We have investigated the change in DC characteristics of AlGaN/GaN HEMTs after the gate-and drain-bias stress at high te... [more] |
ED2007-170 CPM2007-96 LQE2007-71 pp.73-76 |
ED, CPM, LQE |
2006-10-05 15:20 |
Kyoto |
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Interface control for GaN-based electron devices Takeshi Kimura, Junji Kotani, Hiroki Kato, Masafumi Tajima, Eri Ogawa, Chihoko Mizue, Tamotsu Hashizume (Hokkaido University) |
[more] |
ED2006-157 CPM2006-94 LQE2006-61 pp.29-34 |
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