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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
R |
2020-11-30 14:30 |
Online |
Online |
Verification of effect by comparison of temperature cycle test and thermal shock test Yuri Saito, Matsuguma Osamu, Aoki Yuichi (ESPEC) R2020-26 |
(To be available after the conference date) [more] |
R2020-26 pp.17-20 |
R |
2017-11-16 15:30 |
Osaka |
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Effects on Stresses in HALT Raphael Pihet, Takuya Hirata, Hideki Kawai, Aoki Yuichi (ESPEC) R2017-53 |
HALT (Highly Accelerated Limit Test) is an accelerated test which, by applying severe stresses, can identify the relativ... [more] |
R2017-53 pp.13-16 |
RCS |
2014-10-16 14:15 |
Kanagawa |
Keio Univ. |
[Invited Lecture]
5G Mobile Communications for 2020 and Beyond
-- Vision and Key Enabling Technologies -- Yuuichi Aoki (Samsung) RCS2014-169 |
Samsung, as a key player of 5th generation mobile communications, has started research in 5G technologies since 2011. In... [more] |
RCS2014-169 pp.75-80 |
R |
2012-11-15 16:15 |
Osaka |
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The safety and evaluation test of Lithium-Ion Secondary Battery Manabu Okamoto, Hideki Kawai, Arata Okuyama, Yuichi Aoki (Espec Corp.) R2012-65 |
In a lithium-ion secondary battery, this report describes the principle and the subject of safety. The outline of the sa... [more] |
R2012-65 pp.27-30 |
R |
2011-11-18 14:10 |
Osaka |
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Temperature Humidity Test of Silver-Epoxy Isotropic Conductive Adhesive Takuya Hirata, Yuichi Aoki (ESPEC CORP.) R2011-35 |
To evaluate the reliability test condition for Isotropic Conductive Adhesive (ICA), we curried out various temperature h... [more] |
R2011-35 pp.13-17 |
R |
2010-11-19 14:25 |
Osaka |
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Performance Degradation of Photovoltaic Modules with Rapid Thermal-Cycling Yuichi Aoki, Manabu Okamoto (Espec Corp.), Atsushi Masuda, Takuya Doi (AIST) R2010-33 |
To clarify the failure-mode of crystalline-silicon photovoltaic modules on the thermal-cycle test, the modules were expo... [more] |
R2010-33 pp.5-8 |
MW |
2009-09-25 17:15 |
Tokyo |
Univ. of Electro-Communications |
[Special Talk]
Anlysis and Design of a Dynamic Predistorter for WCDMA Handsets Power Amplifier Shingo Yamanouchi, Yuuichi Aoki, Kazuaki Kunihiro (NEC), Tomohisa Hirayama (NEC Electronics Corp.), Takashi Miyazaki (NEC), Hikaru Hida (NEC Electronics Corp.) MW2009-90 |
This paper presents a dynamic predistorter (PD), which linearizes dynamic AM-AM and AM-PM of a wide-band CDMA (WCDMA) ha... [more] |
MW2009-90 pp.93-98 |
RCS, MoNA, WBS, SR, MW (Joint) |
2007-03-09 13:00 |
Kanagawa |
YRP |
[Invited Talk]
Circuit design of highly linear and efficient power amplifiers for WCDMA applications
-- Dynamic predistortion and polar modulation technologies -- Kazuaki Kunihiro, Shingo Yamanouchi, Kiyohiko Takahashi, Yuuichi Aoki (NEC) |
This paper presents linearization and efficiency-enhancement techniques, i.e., dynamic predistortion (PD) and polar modu... [more] |
MW2006-193 pp.1-6 |
OPE, R, CPM |
2005-04-22 14:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Study of accelerate test method for Optical components Yuichi Aoki, Yasutoshi Nakagawa (ESPEC) |
We performed the HAST for adhesive of optical components to compared with High temperature & High humidity test such as ... [more] |
R2005-4 CPM2005-4 OPE2005-4 pp.17-20 |
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