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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2020-02-26
Tokyo   Method for Inserting Fault-Detection-Strengthened Test Point under Multi-cycle Testing
Tomoki Aono, Norihiro Nakaoka, Shyu Saikou, Wang Senling, Higami Yoshinobu, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Youichi Maeda, Jun Matsushima (Renesas) DC2019-89
For guaranteeing the functional safety of an in-vehicle system, a power-on self-test (POST) is required to test the devi... [more] DC2019-89
(Joint) [detail]
Ehime Ehime Prefecture Gender Equality Center Analysis of Fault Detection Degradation Issue in Multi-cycle Test Scheme using Probabilistic Evaluation Method
Norihiro Nakaoka, Tomoki Aono, Sohshi Kudoh, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2019-45 DC2019-69
In order to ensure the functional safety of advanced autonomous driving systems, a power-on self-test
(POST) is require... [more]
VLD2019-45 DC2019-69
DC 2019-02-27
Tokyo Kikai-Shinko-Kaikan Bldg. FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing
Tomoki Aono, Hanan T.Al-Awadhi, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) DC2018-79
Multi-cycle Test is a promising way to reduce the test volume of Logic-BIST (Logic Built-in Self-Test) based POST (Power... [more] DC2018-79
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