IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 7 of 7  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
IE, ICD, VLD, IPSJ-SLDM [detail] 2014-10-02
15:50
Miyagi   Study on Target Impedance of Power Supply Network for Maintain Power and Signal Integrity
Toma Yamaguchi, Toshio Sudo (Shibaura Inst. of Tech.) VLD2014-65 ICD2014-58 IE2014-44
 [more] VLD2014-65 ICD2014-58 IE2014-44
pp.27-32
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2013-11-27
09:15
Kagoshima   Co-design for reducing power supply noises with On-die PDN Impedance
Ryota Kobayashi, Hiroki Otsuka, Genki Kubo, Sho Kiyoshige, Wataru Ichimura, Masahiro Terasaki, Toshio Sudo (Shibaura Inst. of Tech.) CPM2013-109 ICD2013-86
Power integrity is a serious issue in CMOS LSI systems, because power supply noise induces logic instability and electro... [more] CPM2013-109 ICD2013-86
pp.7-12
VLD 2010-09-28
15:00
Kyoto Kyoto Institute of Technology Analysis and Evaluation of Simultaneous Switching Noise of FPGA
Yo Takahashi, Toshio Sudo (SIT), Kunio Ota, Kazuhisa Matsuge (Toshiba) VLD2010-54
FPGAs(Field Programmable Gate Array) are now widely used to digital products. The FPGAs are constituted by CMOS circuit ... [more] VLD2010-54
pp.71-76
ICD, CPM 2007-01-19
15:20
Tokyo Kika-Shinko-Kaikan Bldg. Effects of the Board Power/Ground Layer Configuration on Simultaneous Switching Noise(SSN)and EMI
Takanobu Kushihira (MSC), Toshio Sudo (Toshiba)
The effects of power/ground structure on simultaneous switching noise and radiated emission (EMI) have been investigated... [more] CPM2006-152 ICD2006-194
pp.131-136
ICD, CPM 2007-01-19
15:45
Tokyo Kika-Shinko-Kaikan Bldg. Wid eband Decoupling Properties by the Combination of Ultra-thin Insulator and EBG Structure
Seiju Ichijo (Toshiba), Takanobu Kushihira (MSC), Toshio Sudo (Toshiba)
Wide-band decoupling property of power/ground structure of a printed circuit board is required for the high-speed digita... [more] CPM2006-153 ICD2006-195
pp.137-142
ICD, CPM 2005-09-09
09:50
Tokyo Kikai-Shinko-Kaikan Bldg. Analysis of Transmission Characteristic of High-speed Differential Sgnal Bus
Tsuyoshi Tokiwa, Toshio Sudo (Toshiba), Nobuhiro Tsuruta (Toshiba DME), Yoshihiro Nishida (Toshiba DM)
With performance improvement of CPU, improvement of signal transmission ability between LSI became indispensable. And th... [more] CPM2005-97 ICD2005-107
pp.7-12
ICD, CPM 2005-09-09
13:00
Tokyo Kikai-Shinko-Kaikan Bldg. Simultaneous switching noise(SSN) and EMI of a semiconductor package
Takanobu Kushihira (MSC), Toshio Sudo (TSB)
We tested a series about a Simultaneous Switching Noise(SSN) by influence of the parasitism inductance that a package ha... [more] CPM2005-101 ICD2005-111
pp.29-34
 Results 1 - 7 of 7  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan