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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2011-12-16
09:55		 Osaka   A 65-nm Radiation-Hard Flip-Flop Tolerant to Multiple Cell Upsets
Ryosuke Yamamoto, Chikara Hamanaka (Kyoto Inst. of Tech.), Jun Furuta (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. of Tech.), Hidetoshi Onodera (Kyoto Univ.) ICD2011-129		 MCUs in redundant FFs is a dominant factor in a current deep-submicron process. A layout structure to avoid MCUs is prop... [more] ICD2011-129
pp.131-136
ICD, SDM 2010-08-27
14:10		 Hokkaido Sapporo Center for Gender Equality A 65nm Bistable Cross-coupled Dual Modular Redundancy Flip-Flop Capable of Protecting Soft Errors on the C-element
Jun Furuta (Kyoto Univ.), Chikara Hamanaka, Kazutoshi Kobayashi (Kyoto Inst. of Tech.), Hidetoshi Onodera (Kyoto Univ.) SDM2010-146 ICD2010-61		  [more] SDM2010-146 ICD2010-61
pp.121-124
VLD 2010-03-10
15:25		 Okinawa   Generation Mechanism of SEU and MCU Caused by Parasitic Lateral Bipolar Transitstors
Chikara Hamanaka (Kyoto Institute of Tech.), Jun Furuta, Hiroaki Makino (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Institute of Tech.), Hidetoshi Onodera (Kyoto Univ./JST, CREST) VLD2009-103		 Tolerance for soft-error decreases as integration advances. SEU(Single Event Upset), flipping one bit
and MCU(Multi-Cel... [more]		 VLD2009-103
pp.25-30
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