|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD |
2018-04-20 10:20 |
Tokyo |
|
[Invited Lecture]
An Implementation of 2RW Dual-Port SRAM using 65 nm Silicon-on-Thin-Box (SOTB) for Smart IoT Yohei Sawada, Yoshiki Yamamoto, Takumi Hasegawa, Hiroki Shinkawata, Makoto Yabuuchi (REL), Yoshihiro Shinozaki, Kyoji Ito (NSW), Shinji Tanaka, Nii Koji, Shiro Kamohara (REL) ICD2018-8 |
[more] |
ICD2018-8 pp.29-32 |
SDM, ICD, ITE-IST [detail] |
2017-07-31 10:40 |
Hokkaido |
Hokkaido-Univ. Multimedia Education Bldg. |
A 65 nm 1.0V 1.84ns Silicon-on-Thin-Box (SOTB) Embedded SRAM with 13.72 nW/Mbit Standby Power for Smart IoT Makoto Yabuuchi, Koji Nii, Shinji Tanaka (Renesas), Shinozaki Yoshihiro (Nippon Systemware), Yoshiki Yamamoto, Takumi Hasegawa, Hiroki Shinkawata, Shiro Kamohara (Renesas) SDM2017-33 ICD2017-21 |
[more] |
SDM2017-33 ICD2017-21 pp.13-16 |
SDM |
2016-10-26 15:30 |
Miyagi |
Niche, Tohoku Univ. |
[Invited Talk]
Back-Bias Control Technique for Suppression of Die-to-Die Delay Variability of SOTB CMOS Circuits at Ultralow-Voltage (0.4 V) Operation Hideki Makiyama, Yoshiki Yamamoto, Takumi Hasegawa, Shinobu Okanishi, Keiichi Maekawa, Hiroki Shinkawata, Shiro Kamohara, Yasuo Yamaguchi (Renesas Electronics Corp.), Nobuyuki Sugii (Hitach), Koichiro Ishibashi (The Univ. of Electro-Communications), Tomoko Mizutani, Toshiro Hiramoto (The Univ. of Tokyo) SDM2016-71 |
Small-variability transistors such as silicon on thin buried oxide (SOTB) are effective for reducing the operation volta... [more] |
SDM2016-71 pp.15-20 |
SDM, ICD |
2015-08-24 10:20 |
Kumamoto |
Kumamoto City |
Development of a compacted doubly nesting array in Narrow Scribe Line aimed at detecting soft failures of interconnect via Hiroki Shinkawata, Nobuo Tsuboi (REL), Atsushi Tsuda (RSD), Shingo Sato (Kansai), Yasuo Yamaguchi (REL) SDM2015-58 ICD2015-27 |
We introduce a new addressable test structure array using for mass production stage which is compacted doubly nesting ar... [more] |
SDM2015-58 ICD2015-27 pp.7-10 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|