IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 21 - 33 of 33 [Previous]  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ED, SDM 2014-02-27
16:10
Hokkaido Hokkaido Univ. Centennial Hall Seebeck-coefficient control of ultrathin SOI layer and its novel characterization technique
Hiroya Ikeda, Yuhei Suzuki, Kazutoshi Miwa (Shizuoka Univ.), Faiz Salleh (Shizuoka Univ./JSPS) ED2013-137 SDM2013-152
The enhancement of the thermoelectric performance has been expected by Si nanostrucutres. The Si Seebeck coefficient is ... [more] ED2013-137 SDM2013-152
pp.31-35
SDM, ED, CPM 2013-05-16
16:35
Shizuoka Shizuoka Univ. (Hamamatsu) Graduate School of Sci. and Technol. Focused ion beam Ga implantation into P-doped SOI layer and its Seebeck coefficient
Yuhei Suzuki, Kazutoshi Miwa (Shizuoka Univ.), Faiz Salleh (Shizuoka Univ./ Research Fellow of JSPS), Masaru Shimomura, Akihiro Ishida, Hiroya Ikeda (Shizuoka Univ.) ED2013-22 CPM2013-7 SDM2013-29
With the aim of fabricating a thermopile infrared detector using Si nanowires, we have investigated the formation of a p... [more] ED2013-22 CPM2013-7 SDM2013-29
pp.33-37
SDM, ED 2013-02-27
14:10
Hokkaido Hokkaido Univ. Variation of Seebeck coefficient of Si-on-insulator layer induced by bias-injected carriers
Hiroya Ikeda, Yuhei Suzuki, Kazutoshi Miwa (Shizuoka Univ.), Faiz Salleh (Shizuoka Univ./Research Fellow of JSPS) ED2012-129 SDM2012-158
The enhancement of Seebeck coefficient by controlling the Si Fermi energy is one of key issues for enhancing the thermoe... [more] ED2012-129 SDM2012-158
pp.7-11
ED, SDM 2012-02-08
11:00
Hokkaido   Seebeck Coefficient of Ultrathin Si with Fermi Energy Controlled by External Bias
Faiz Salleh, Kazutoshi Miwa, Hiroya Ikeda (Shizuoka Univ.) ED2011-153 SDM2011-170
We varied the Seebeck coefficient of an n-type silicon-on-insulator (SOI) sample by applying an external bias in order t... [more] ED2011-153 SDM2011-170
pp.65-69
SDM, ED 2011-02-23
14:10
Hokkaido Hokkaido Univ. A novel refrigerator using a single-electron-pump operation fabricated from semiconductor materials
Hiroya Ikeda, Faiz Salleh (Shizuoka Univ.) ED2010-193 SDM2010-228
We propose a novel single-electron-refrigerator which consists of a single-electron box and a single-electron pump. Its ... [more] ED2010-193 SDM2010-228
pp.7-12
SDM, ED 2011-02-23
14:35
Hokkaido Hokkaido Univ. Theoretical Estimation of Seebeck Coefficient in P-Doped Si Ultrathin Si Films
Faiz Salleh, Hiroya Ikeda (Shizuoka Univ.) ED2010-194 SDM2010-229
 [more] ED2010-194 SDM2010-229
pp.13-17
SDM, CPM, ED 2010-05-13
14:45
Shizuoka Shizuoka University (Hamamatsu Campus) Theoretical study on novel Si single-electron refrigerator
Hiroya Ikeda, Faiz Salleh (Shizuoka Univ.) ED2010-20 CPM2010-10 SDM2010-20
We have proposed a novel single-electron-refrigerator (SER) device which can be fabricated in Si-on-insulator wafers and... [more] ED2010-20 CPM2010-10 SDM2010-20
pp.17-21
ED, SDM 2010-02-22
13:25
Okinawa Okinawaken-Seinen-Kaikan Seebeck coefficient in heavily-doped SOI layers
Hiroya Ikeda, Faiz Salleh (Shizuoka Univ.) ED2009-197 SDM2009-194
We have investigated the Seebeck coefficient of Si nanostructures, especially, ultrathin P-doped SOI (silicon-on-insulat... [more] ED2009-197 SDM2009-194
pp.5-9
SDM, ED 2009-02-27
11:45
Hokkaido Hokkaido Univ. Thermoelectric characteristics of Si nanostructures for a high-efficiency thermoelectric device
Hiroya Ikeda, Faiz Salleh, Kiyosumi Asai, Akihiro Ishida (Shizuoka Univ.) ED2008-238 SDM2008-230
In order to develop a high-efficiency thermoelectric device, we have investigated the thermoelectric characteristic... [more] ED2008-238 SDM2008-230
pp.81-85
ED, SDM 2008-01-30
14:45
Hokkaido   Design of dopant-induced quantum dot arrays in silicon nanostructures for single-electron transfer
Daniel Moraru, Daisuke Nagata, Kiyohito Yokoi, Hiroya Ikeda, Michiharu Tabe (Shizuoka Univ.) ED2007-240 SDM2007-251
Randomly distributed dopants in the channel of silicon-on-insulator (SOI) field-effect transistors (FETs) can introduce ... [more] ED2007-240 SDM2007-251
pp.17-22
ED, SDM 2008-01-31
09:00
Hokkaido   Development of high-efficiency thermoelectric devices using Si nanostructures
Hiroya Ikeda, Naomi Yamashita (Shizuoka Univ.) ED2007-244 SDM2007-255
In order to obtain the thermoelectric characteristics enough for practical use, we make use of nanostructures in the the... [more] ED2007-244 SDM2007-255
pp.39-42
SDM, ED 2007-02-02
13:20
Hokkaido   Time-controlled single-electron transfer in single-gated asymmetric multiple tunnel junction arrays
Daniel Moraru (Shizuoka Univ.), Yukinori Ono (NTT), Hiroshi Inokawa, Kiyohito Yokoi, Ratno Nuryadi, Hiroya Ikeda, Michiharu Tabe (Shizuoka Univ.)
 [more] ED2006-255 SDM2006-243
pp.83-88
ED, CPM, SDM 2006-05-19
15:00
Aichi VBL, Toyohashi University of Technology Tunneling current oscillations in Si/SiO2/Si structures
Daniel Moraru, Daisuke Nagata (Shizuoka Univ.), Seiji Horiguchi (Akita Univ.), Ratno Nuryadi, Hiroya Ikeda, Michiharu Tabe (Shizuoka Univ.)
 [more] ED2006-40 CPM2006-27 SDM2006-40
pp.113-117
 Results 21 - 33 of 33 [Previous]  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan