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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| DC | 2009-06-19 10:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Note on Yield and Area Trade-offs for MBIST in SoC Masayuki Arai, Tatsuro Endo, Kazuhiko Iwasaki (Tokyo Metro. Univ.), Michinobu Nakao, Iwao Suzuki (Renesas Tech Corp.)  DC2009-11 |
In this study we evaluate the effectiveness of hardware overhead reduction of memory BIST and spare assignment algorithm... [more] | DC2009-11 pp.7-12 |
| DC | 2009-02-16 14:40 |
Tokyo | Note on Small Delay Fault Model for Intra-Gate Resistive Open Defects Masayuki Arai, Akifumi Suto, Kazuhiko Iwasaki (Tokyo Metro. Univ.), Katsuyuki Nakano, Michihiro Shintani, Kazumi Hatayama, Takashi Aikyo (STARC) DC2008-75 |
[more] | DC2008-75 pp.43-48 |
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| DC | 2008-12-12 13:50 |
Yamaguchi | On the Analysis of an Evaluation Model for Fault Tolerant Processors Satoshi Fukumoto, Masayuki Arai, Kazuhiko Iwasaki (Tokyo Metropolitan Univ.) DC2008-61 |
In this report, we have additional discussion about out stochastic model for evaluating the fault tolerant processors. T... [more] | DC2008-61 pp.11-13 |
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| DC | 2008-10-20 14:20 |
Tokyo | National Center of Sciences | A Note on Evaluation Techniques for Fault Tolerant Processor Satoshi Fukumoto, Masayuki Arai, Kazuhiko Iwasaki (Tokyo Metropolitan Univ.) DC2008-24 |
In these years, several fault tolerant processors are studies and proposed in order to do away with transient faults tak... [more] | DC2008-24 pp.13-16 |
| DC | 2008-06-20 13:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg | A Design of Highly Dependable Processor with the Tolerance to Multiple Simultaneous Transient Faults Makoto Kimura, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki (Tokyo Metroplitan Univ.) DC2008-13 |
We propose the methodology to make a highly reliable processor against multiple simultaneous transient faults. In our pr... [more] | DC2008-13 pp.13-18 |
| DC | 2008-06-20 16:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Note on Hardware Overhead and Fault Location for Memory BIST Masayuki Arai, Kentaro Osawa, Kazuhiko Iwasaki (Tokyo Metro. Univ.), Michinobu Nakao (Renesas) DC2008-18 |
[more] | DC2008-18 pp.41-46 |
| DC | 2008-02-08 11:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Note on Test Power Reduction for Scan-Based Hybrid BIST Akifumi Suto, Masayuki Arai, Kazuhiko Iwasaki (Tokyo Metro. Univ.) DC2007-72 |
[more] | DC2007-72 pp.33-38 |
| DC | 2008-02-08 16:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Note on Testing of RF Transmitter Considering Component Variation Tatsuro Endo, Masayuki Arai, Kazuhiko Iwasaki (Tokyo Metro. Univ.) DC2007-81 |
As the higher integration level and more complexity on RF ICs, testing of them has been becoming a important problem. RF... [more] | DC2007-81 pp.89-94 |
| DE, DC | 2007-10-15 16:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Time Assignment of Nodes in the Replication Protocol for Multigenerational Data Conservation Satoshi Fukumoto, Takahiko Ikeda, Masayuki Arai, Kazuhiko Iwasaki (Tokyo Metropolitan Univ.) DE2007-122 DC2007-19 |
This paper discusses time assignment of nodes in the replication protocol for multigenerational data conservation. We in... [more] | DE2007-122 DC2007-19 pp.43-46 |
| DE, DC | 2007-10-16 11:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Evaluation Model of Pseudo Random Pattern Quality for Logic BIST Satoshi Fukumoto, Harunobu Kurokawa, Masayuki Arai, Kazuhiko Iwasaki (Tokyo Metropolitan Univ.) DE2007-124 DC2007-21 |
In this paper, we discuss the stochastic and statistical analyses on the distribution of fault coverage in random-patter... [more] | DE2007-124 DC2007-21 pp.51-56 |
| ICD, CPM | 2007-01-19 13:25 |
Tokyo | Kika-Shinko-Kaikan Bldg. | A Note on 100x Test Data Compression for Scan-Based BIST Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki (Tokyo Metro. Univ.), Tatsuru Matsuo, Takahisa Hiraide (Fujitsu Lab.), Hideaki Konishi, Michiaki Emori, Takashi Aikyo (Fujitsu) |
[more] | CPM2006-149 ICD2006-191 pp.115-120 |
| CPSY, DC | 2006-04-14 10:00 |
Tokyo | Takeda Hall | Data Replication Protocol for Multigenerational Data Conservation Takahiko Ikeda, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki (Tokyo Metropolitan Univ.) |
For data replication techniques, several protocols have been proposed to trade between write and read overheads. Ho... [more] |
CPSY2006-3 DC2006-3 pp.13-18 |
| VLD, ICD, DC, IPSJ-SLDM | 2005-12-02 10:20 |
Fukuoka | Kitakyushu International Conference Center | A Note on Expansion of Convolutional Compactors on Galois Field Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki (Tokyo Metro. Univ.) |
Convolutional compactors offer a promising technique of compacting test responses. In this study we expand the architect... [more] | VLD2005-78 ICD2005-173 DC2005-55 pp.13-18 |
| DE, DC | 2005-10-17 13:15 |
Tokyo | NTT Musashino R&D center | Optimal Checkpoint Interval for Hybrid State Saving with Bound Rollbacks Mamoru Ohara, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki (Tokyo Metropolitan Univ.) |
This paper discusses distributed periodic checkpointing for practical applications running with limited resources. We pr... [more] | DE2005-127 DC2005-21 pp.13-18 |
| ICD, CPM | 2005-01-28 15:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Selection of Seeds and Phase Shifters for Scan BIST Masayuki Arai, Harunobu Kurokawa, Kenichi Ichino, Satoshi Fukumoto, Kazuhiko Iwasaki (Tokyo Metro. Univ.) |
In this paper, we discuss the application of a seed-selection procedure for LFSR-based BIST to multiple scan chains, com... [more] | CPM2004-171 ICD2004-216 pp.53-58 |
| DE, DC | 2004-10-18 11:30 |
Tokyo | Tokyo Institute of Technology | Tabito Suzuki, Mamoru Ohara, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki (Tokyo Met. Univ.) |
[more] | DE2004-107 DC2004-22 pp.5-10 |
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