Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-30 10:05 |
Miyazaki |
NewWelCity Miyazaki |
Capture power reduction in multi-cycle test structure Hisato Yamaguchi, Makoto Matsuzono, Kohei Miyase, Yasuo Sato, Seiji Kajihara (KIT) VLD2011-83 DC2011-59 |
Power consumption during Built-In Self-Test(BIST) is far larger than that of normal operation. Therefore, it may lead to... [more] |
VLD2011-83 DC2011-59 pp.179-183 |
DC |
2011-06-24 16:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Low Power At-Speed Scan Testing for LOS Scheme by Test Vector Modification Kohei Miyase, Yuta Uchinodan, Kazunari Enokimoto (KIT), Yuta Yamato (NAIST), Xiaoqing Wen, Seiji Kajihara (KIT), Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Arnaud Verazel (Lirmm) DC2011-13 |
In this paper, we present a test vector modification method to reduce launch-to-capture power for LOS scheme. The propos... [more] |
DC2011-13 pp.29-34 |
DC |
2011-02-14 10:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Capture-Safety Checking Based on Transition-Time-Relation for At-Speed Scan Test Vectors Ryota Sakai, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech.), Masao Aso, Hiroshi Furukawa (RMS), Yuta Yamato (Fukuoka Ind. Sci & Tech/Fundation FIST), Seiji Kajihara (Kyushu Inst. of Tech.) DC2010-60 |
Excessive capture power in at-speed scan testing may cause timing failures, resulting in test-induced yield loss. This h... [more] |
DC2010-60 pp.7-12 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 16:05 |
Fukuoka |
Kyushu University |
Rotating Test and Pattern Partitioning for Field Test Senling Wang, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen (Kyushu Insti. Tech.) |
[more] |
|
DC |
2010-02-15 14:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
On Calculation of Delay Test Quality for Test Cubes and X-filling Shinji Oku, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech./JTS) DC2009-73 |
This paper proposes a method to compute delay values in 3-valued fault simulation for test cubes which are test patterns... [more] |
DC2009-73 pp.51-56 |
DC |
2010-02-15 15:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
High Speed X-Fault Diagnosis with Partial X-Resolution Kohei Miyase (Kyushu Inst. of Tech.), Yusuke Nakamura (Panasonic Communications Software Co.,Ltd.), Yuta Yamato, Xiaoqing Wen, Seiji Kajihara (Kyushu Inst. of Tech.) DC2009-76 |
Defects behavior of ultra small size and high speed LSI is getting complicated. It makes localization of fault site and ... [more] |
DC2009-76 pp.69-74 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2009-12-03 14:05 |
Kochi |
Kochi City Culture-Plaza |
Optimizing Don't-Care Bit Rate Derived from X-Identification for Reduction of Switching Activity Isao Beppu (Kyushu Institute of Tech), Kohei Miyase (Kyushu Institute of Tech/JST), Yuta Yamato (Kyushu Institute of Tech), Xiaoqing Wen, Seiji Kajihara (Kyushu Institute of Tech/JST) VLD2009-55 DC2009-42 |
Increase of power dissipation and IR-drop during scan-shifting operation and/or capture operation is still challenging p... [more] |
VLD2009-55 DC2009-42 pp.95-100 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2009-12-04 14:25 |
Kochi |
Kochi City Culture-Plaza |
A Path Selection Method of Delay Test for Transistor Aging Mitsumasa Noda (Kyushu Institute of Tech.), Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen (Kyushu Institute of Tech./JST), Yukiya Miura (Tokyo Metropolitan Univ./JST) VLD2009-65 DC2009-52 |
With the advanced VLSI process technology, it is important for reliability of VLSIs to deal with faults caused by aging.... [more] |
VLD2009-65 DC2009-52 pp.167-172 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2008-11-17 13:50 |
Fukuoka |
Kitakyushu Science and Research Park |
A Capture-Safe Test Generation Scheme for At-speed Scan Testing Atsushi Takashima, Yuta Yamato, Hiroshi Furukawa, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyusyu Institute of Technology) VLD2008-62 DC2008-30 |
Capture-safety, defined as the avoidance of any timing error due to unduly high switching activity in capture mode durin... [more] |
VLD2008-62 DC2008-30 pp.13-18 |
DC |
2008-06-20 16:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
Transistor Aging and Operational Environment of Logic Circuits Masafumi Haraguchi (Kyushu Inst. of Tech.), Yukiya Miura (Tokyo Metropolitan Univ.), Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech.) DC2008-17 |
With the progress of integrated circuit technology, it is becoming important to consider circuit aging. In this work we ... [more] |
DC2008-17 pp.35-40 |
VLD, CPSY, RECONF, DC, IPSJ-SLDM, IPSJ-ARC (Joint) [detail] |
2007-11-20 10:30 |
Fukuoka |
Kitakyushu International Conference Center |
A Transition Delay Test Generation Method for Capture Power Reduction during At-Speed Scan Testing Tomoaki Fukuzawa, Kohei Miyase, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara (KIT) VLD2007-71 DC2007-26 |
High power dissipation can occur when a response to the test vector is captured by flip-flops in at-speed scan testing, ... [more] |
VLD2007-71 DC2007-26 pp.7-12 |
R |
2007-09-14 13:40 |
Kochi |
Kochi Univ. of Technology |
An expanded Per-Test X-Fault Diagnosis Method for LSI Circuits Yusuke Nakamura, Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara (KIT), K. K. Saluja (Univ. of Wisconsin) R2007-33 |
The behavior of defects has become complex and more than one defects often occur in a single circuit due to shrinking fe... [more] |
R2007-33 pp.23-28 |
ICD, CPM |
2007-01-19 13:00 |
Tokyo |
Kika-Shinko-Kaikan Bldg. |
A Constrained Test Generation Method for Low Power Testing Yoshiaki Tounoue, Xiaoqing Wen, Seiji Kajihara (K I T), Kohei Miyase (JST), Tatsuya Suzuki, Yuta Yamato (K I T) |
High Power dissipation when the response to a test vector is captured by flip-flops in scan testing which may cause exce... [more] |
CPM2006-148 ICD2006-190 pp.109-114 |
RECONF, CPSY, VLD, DC, IPSJ-SLDM, IPSJ-ARC (Joint) [detail] |
2006-11-28 11:45 |
Fukuoka |
Kitakyushu International Conference Center |
Test relaxation for N-detection test patterns in broad-side delay testing Kenjiro Taniguchi (Kyushu Inst. of Tech.), Kohei Miyase (JST), Seiji Kajihara, Xiaoqing Wen (Kyushu Inst. of Tech.) |
[more] |
VLD2006-57 DC2006-44 pp.35-40 |
VLD, ICD, DC, IPSJ-SLDM |
2005-12-02 09:30 |
Fukuoka |
Kitakyushu International Conference Center |
On Low Capture Power Test Generation for Scan Testing Tatsuya Suzuki, Xiaoqing Wen, Seiji Kajihara (K.I.T.), Kohei Miyase, Yoshihiro Minamoto (JST) |
High switching activity occurs when the response to a test vector is captured by flip-flops during scan testing. This ma... [more] |
VLD2005-76 ICD2005-171 DC2005-53 pp.1-6 |