IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 9 of 9  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2014-04-18
13:30
Toyama Univ. Toyama Evaluation of voltage between signal line and ground line generated by near-EM disturbance
Atsushi Nagao, Farhan Zaheed Mahamood, Yuichiro Okugawa, Shin Kanno, Kazuhiro Takaya (NTT) EMCJ2014-2
Because of the increased demand for using wireless devices near from communication equipments, establishing the RF immun... [more] EMCJ2014-2
pp.7-12
EMCJ, ITE-BCT 2013-03-08
11:05
Tokyo Kikai-Shinko-Kaikan Bldg. Availability of the AMN as impedance stabilization network for measuring inrush currents of lighting equipment.
Shin Kanno (NTT) EMCJ2012-127
 [more] EMCJ2012-127
pp.25-29
EMCJ
(2nd)
2012-11-29
13:30
Tokyo NICT A study on the interference characteristics of ZigBee systems on IEEE 802.11g
Yuichiro Okugawa, Atsushi Nagao, Shin Kanno, Yoshiharu Akiyama (NTT E&E Labs.)
In this paper, experimental results on the
frame error rate (FER) of an IEEE 802.11g based
wireless LAN (WLAN) system ... [more]

EMCJ 2012-01-27
11:10
Fukuoka Kyushu Univ. A Study on Conducted Disturbances Measurement by using CDNE -- Necessity of LCL Requirements --
Norihito Hirasawa, Shin Kanno, Yoshiharu Akiyama (NTT) EMCJ2011-117
An alternative test method for radiated emission measurement emitted from the lighting equipment in frequency range 30 t... [more] EMCJ2011-117
pp.37-40
EMCJ, IEE-EMC 2011-12-09
09:45
Aichi Nagoya Inst. of Tech. A study on the correlation between common mode voltage measured by using CDNE and radiated electromagnetic field strength emitted from LED bulbs.
Shin Kanno, Norihito Hirasawa, Yoshiharu Akiyama (NTT) EMCJ2011-98
 [more] EMCJ2011-98
pp.13-17
EMCJ, IEE-EMC 2010-06-18
11:35
Osaka Osaka Univ. The mechanism and characteristics of electromagnetic disturbances emitted from LED and fluorescent bulbs.
Shin Kanno, Yoshiharu Akiyama (NTT) EMCJ2010-15
The illuminator using high luminance LED gains power as an electronic device in recent years upgrades. Only the inverter... [more] EMCJ2010-15
pp.31-34
EE 2008-10-03
13:30
Tokyo Kikai-Shinko-Kaikan Bldg. A study of reduction method of rush-current and its implementaion -- Design, Simulation and Imprementation --
Shin Kanno, Kimihiro Tajima, Yousuke Nozaki, Tadahito Aoki (NTT) EE2008-39
 [more] EE2008-39
pp.23-28
EMCJ 2007-01-26
14:50
Kagoshima   A Study of Transient Noise Current Reduction Method foe Fluorescent Light Using an Inverter System.
Shin Kanno, Kimihiro Tajima (NTT) EMCJ2006-106
 [more] EMCJ2006-106
pp.45-49
EMCJ 2005-05-26
11:20
Hyogo Awaji Yumebutai International Conference Center A Study of Continuous and Transient Disturbance Wave Characteristics of Fluorescent Light Using an Inverter System
Shin Kanno (NTT), Yoshinori Saito (NTT EAST), Tetsuya Tominaga (NTT), Ryuichi Kobayashi, Yasuhiko Tada (NTT EAST), Hiroshi Yamane (NTT)
This paper describes measurement results of a disturbance produced by a fluorescent light. With advent of electronics de... [more] EMCJ2005-15
pp.29-33
 Results 1 - 9 of 9  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan