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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM, ICD |
2013-08-02 14:25 |
Ishikawa |
Kanazawa University |
[Invited Talk]
A 10th Generation 16-Core SPARC64 Processor for Mission-Critical UNIX Server Ryuji Kan, Tomohiro Tanaka, Go Sugizaki, Ryuichi Nishiyama, Sota Sakabayashi (Fujitsu), Yoichi Koyanagi (Fujitsu Laboratories), Ryuji Iwatsuki, Kazumi Hayasaka (Fujitsu), Taiki Uemura (Fujitsu Semiconductor), Gaku Itou, Yoshitomo Ozeki, Hiroyuki Adachi, Kazuhiro Furuya, Tsuyoshi Motokurumada (Fujitsu) SDM2013-83 ICD2013-65 |
A 10th generation SPARC64 processor is fabricated in enhanced 28nm CMOS process. It runs at 3.0GHz and contains 16 cores... [more] |
SDM2013-83 ICD2013-65 pp.95-98 |
ICD |
2012-12-18 10:55 |
Tokyo |
Tokyo Tech Front |
[Invited Talk]
Soft-error evaluation and mitigation technologies Taiki Uemura (Fujitsu Semiconductor Ltd.) ICD2012-116 |
Soft-Error is transient error in electron devices. Soft-error is triggered by cosmic-ray induced neutrons and alpha rays... [more] |
ICD2012-116 pp.103-108 |
SDM |
2010-11-12 13:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Modeling of Single-Event-Transient Pulse Generation in Inverter Cells Katsuhiko Tanaka, Hideyuki Nakamura, Taiki Uemura, Kan Takeuchi, Toshikazu Fukuda, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete) SDM2010-180 |
Soft errors in logic circuits due to the propagation of erroneous signal caused by ionized particle generated by cosmic ... [more] |
SDM2010-180 pp.47-52 |
ICD |
2005-04-15 14:30 |
Fukuoka |
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New Development of Neutron-induced Soft-Error Simulation Technology Taiki Uemura, Yoshiharu Tosaka, Yoshio Ashizawa, Hideki Oka, Shigeo Satoh (Fujitsu lab.) |
In these years, the interest in soft error becomes increasing. This comes from the problem that the soft error occurs no... [more] |
ICD2005-19 pp.37-42 |
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