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Committee Date Time Place Paper Title / Authors Abstract Paper #
SIS, IPSJ-AVM 2022-06-09
15:00		 Fukuoka KIT(Wakamatsu Campus)
(Primary: On-site, Secondary: Online)		 [Invited Talk] Advanced applications of machine learning techniques towards high-performance and cost-effective visual inspection AI
Terumasa Tokunaga (Kyutech) SIS2022-6		 Visual inspection is an essential step for quality control in manufacturing. Recently, many researchers have shown great... [more] SIS2022-6
p.30
IBISML 2018-11-05
15:10		 Hokkaido Hokkaido Citizens Activites Center (Kaderu 2.7) [Poster Presentation] Development of the topology-preserving image alignment based on a local deformation of kernel density function
Masataka Watajima (KIT), Sayuri Kuge, Takeshi Ishihara (KU), Yuichi Iino (UT), Ryo Yoshida (ISM), Terumasa Tokunaga (KIT) IBISML2018-55		 Image alignment or image registration is a process for aligning two or more images into a common coordinate system. Many... [more] IBISML2018-55
pp.83-90
NC, IPSJ-BIO, IBISML, IPSJ-MPS
(Joint) [detail]		 2015-06-24
11:00		 Okinawa Okinawa Institute of Science and Technology Tracking multiple cells with a spatial particle filter
Osamu Hirose, Shotaro Kawaguchi (Kanazawa Univ.), Terumasa Tokunaga (Kyutech), Yu Toyoshima (Univ. Tokyo), Takayuki Teramoto, Sayuri Kuge, Takeshi Ishihara (Kyushu Univ.), Yuichi Iino (Univ. Tokyo), Ryo Yoshida (ISM) IBISML2015-18		  [more] IBISML2015-18
pp.137-141
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