| IEICE Technical Committee Submission System Conference Schedule |
Online Proceedings [Sign in] Tech. Rep. Archives |
All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMD, R | 2017-02-17 13:00 |
Shiga | Omuron Kusatsu Factory | Properties of contact lubricant under high temperature and contact resistance Terutaka Tamai (Elcontech), Masahiro Yamakawa (TETRA)  R2016-60 EMD2016-87 |
At the present time, as downsizing of connectors causes thin gold plated layer and low contact load, serious problem of ... [more] | R2016-60 EMD2016-87 pp.1-7 |
| EMD | 2016-10-21 15:45 |
Kanagawa | Degradation of gold plated contacts under high temperature and effectiveness of contact lubricant Terutaka Tamai (Elcontech), Masahiro Yamakawa, Yuta Nakamura (Tetra), Ichiro Takano (Kokgakuin) EMD2016-49 |
Contact failures for down size of connector contacts with low contact force and cost down of gold plated are serious pro... [more] | EMD2016-49 pp.19-27 |
|
| EMD | 2015-11-05 16:50 |
Miyagi | Tohoku University, School of engineering, Aoba memorial hall | Effect of Contact Lubricant on Contact Resistance Characteristics
-- Contact Resistance of Lubricated Surface and Observation of Lubricant Molecules -- Terutaka Tamai (Elcontech), Masahiro Yamakawa, Yuta Nakamura (TETRA) EMD2015-73 |
[more] | EMD2015-73 pp.35-40 |
| EMD, R | 2014-02-21 14:30 |
Osaka | Effect of self-magnetic field on current flowing through true contact area Terutaka Tamai (Elcontech), Shigeru Sawada, Yasuhiro Hattori (AutoNetworks) R2013-87 EMD2013-143 |
As size of true contact are in contact interface is very small comparing apparent area, the current which flow the true ... [more] | R2013-87 EMD2013-143 pp.19-24 |
|
| EMD, R | 2013-02-15 13:35 |
Mie | Sumitomo Wiring System, Ltd | Visualization of electric current in contact and effect of thin film on contact resistance Shigeru Sawada, Shigeki Tsukiji (Mie Univ.), Shigeki Shimada (Sumitomo Electric Industries), Terutaka Tamai (Elcontech), Yasuhiro Hattori (ANTech) R2012-72 EMD2012-103 |
The mathematical solutions and electrical field analysis results of current density distribution in electric contact hav... [more] | R2012-72 EMD2012-103 pp.1-6 |
| EMD, R | 2012-02-17 14:40 |
Kyoto | Effect of Contact Sliding on Contact Resistance Characteristics Syougo Sasayama (Mie Univ.), Yasushi Saitoh (ANtech), Terutaka Tamai (ELtech), Kazuo Iida (Mie Univ.), Yasuhiro Hattori (ANtech) R2011-49 EMD2011-123 |
The contact resistance characteristics with contact load which considered wiping by making distance and load into a para... [more] | R2011-49 EMD2011-123 pp.41-44 |
|
| EMD | 2011-11-18 08:45 |
Akita | Akita Univ. Tegata Campus | Current Density Analysis in Contact Area by Using Light Emission Diode Wafer Shigeru Sawada, Shigeki Tsukiji (Mie Univ.), Terutaka Tamai (ElconTech Consulting), Yasuhiro Hattori (Autonetworks Lab.) EMD2011-88 |
In order to clarify the theory of contact resistance, there are many reports in these years. Mathematically the constri... [more] |
EMD2011-88 pp.115-119 |
| EMD | 2011-11-18 09:05 |
Akita | Akita Univ. Tegata Campus | Estimation of Contact Resistance of Tin Plated Ccontacts by Fretting Corrosion Soshi Masui, Shigeru Sawada (Mie Univ.), Terutaka Tamai (ElconTech Consulting), Yasuhiro Hattori (Autonetworks Lab.), Kazuo Iida (Mie Univ.) EMD2011-89 |
[more] | EMD2011-89 pp.121-126 |
| EMD | 2011-11-18 09:25 |
Akita | Akita Univ. Tegata Campus | Deformation of Crystal Morphology in Tin Plated Contact Layer caused by Loading Terutaka Tamai (Elcontech Consulting), Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks Lab.) EMD2011-90 |
Tin (Sn) plated contacts are widely applied to connector contacts in aut omotive industries. Surfaces of plated tin are... [more] |
EMD2011-90 pp.127-132 |
| EMD | 2011-10-21 13:25 |
Tokyo | Tachikawa-Shiminn-kaikan | Investigation of Environments for Connectors on Vehicle Yuya Saruwatari (Mie Univ), Yasushi Saitoh, Terutaka Tamai (ANtech), Kazuo Iida (Mie Univ), Yasuhiro Hattori (ANtech) EMD2011-59 |
Recently years, according to downsizing of connectors which applied to automobiles, reductions of contact load in connec... [more] | EMD2011-59 pp.13-18 |
| EMD | 2011-03-04 13:30 |
Saitama | Nippon Institute of Technology | Evaluation of Contact Probe for Contact Resistance Measurement Satoru Oohira, Soushi Masui, Shigeru Sawada, Terutaka Tamai, Kazuo Iida (Mie Univ), Yasuhiro Hattori (AN-Tech) EMD2010-157 |
[more] | EMD2010-157 pp.21-24 |
| EMD | 2011-03-04 14:15 |
Saitama | Nippon Institute of Technology | Influence of Thermal Environments for Connectors on Vehicle Jin Hirabayashi, Yuya Saruwatari, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ), Yasuhiro Hattori (ANT) EMD2010-159 |
Connectors for vehicle are used under very severe conditions and grow worse by temperature changes and vibrations when v... [more] | EMD2010-159 pp.29-32 |
| EMD, R | 2011-02-18 13:05 |
Shizuoka | Shizuoka Univ. (Hamamatsu) | Peculiar Phenomena for Increase in Friction Coefficient due to Application of Lubrication Terutaka Tamai, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AN Lab.) R2010-42 EMD2010-143 |
For tin plated connector contacts, it was found that friction coefficient at lubricated contacts was higher than the fri... [more] | R2010-42 EMD2010-143 pp.1-6 |
| EMD, R | 2011-02-18 13:30 |
Shizuoka | Shizuoka Univ. (Hamamatsu) | Direct Viewing of Current in Contact Area used by Light Emission Diode Shigeki Tsukiji, Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ.) R2010-43 EMD2010-144 |
[more] | R2010-43 EMD2010-144 pp.7-12 |
| EMD | 2011-01-28 13:50 |
Tokyo | Japan Aviation Electronics Industry,Limited | Measurement of Contact Resistance Distribution in Fretting Corrosion Track for the Tin Plated Contacts Soushi Masui, Shigeru Sawada, Terutaka Tamai (Mie Univ), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ) EMD2010-137 |
It is observed that contact resistance for tin plated contact in automotive connectors increased due to fretting corrosi... [more] | EMD2010-137 pp.11-16 |
| EMD | 2010-03-05 13:00 |
Kanagawa | Yokohama National University | Relation between Oxidation Thickness and Contact Resistance on Fretting Corrosion of the Tin Plated Contacts Soshi Masui, Shigeru Sawada, Terutaka Tamai, Kazuo Iida (Mie Univ.) EMD2009-127 |
(To be available after the conference date) [more] | EMD2009-127 pp.1-4 |
| EMD | 2010-03-05 13:15 |
Kanagawa | Yokohama National University | Influence of Aging on Contact Resistance and Mechanical Characteristics of Tin Plated Contacts Yuichi Tominaga (Mie Univ.), Takuya Yamanaka (AutoNetworks Technologies, Ltd.), Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.) EMD2009-128 |
We kept tin plated specimens in the aging chamber heated at 100 degrees in order to grow oxidation film. Then we measure... [more] | EMD2009-128 pp.5-8 |
| EMD | 2010-03-05 16:20 |
Kanagawa | Yokohama National University | Effect of liquid paraffin for fretting corrosion Yosuke Miura, Daiji Ito, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (AutoNetwork Technologies) EMD2009-139 |
Fretting corrosion is the serious problem with the miniaturization of the automotive connector. If fretting corrosion h... [more] |
EMD2009-139 pp.49-52 |
| EMD, R | 2010-02-19 15:20 |
Osaka | Observation of wear status of tin plating for automotive connector at initial stage of sliding Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.), Kazuo Iida (Mie Univ.) R2009-56 EMD2009-123 |
Tin plated contacts are widely used for common electrical contact due to the inexpensive and reliability. On the other h... [more] | R2009-56 EMD2009-123 pp.37-42 |
|
| EMD, R | 2010-02-19 15:45 |
Osaka | Physical characteristics of oxide film grown on tin plated contact surface of connectors under high temperatures in the air and its effect on contact resistance Yuya Nabeta, Shigeru Sawada, Yasushi Saitoh (Mie Univ.), Atsushi Shimizu, Yasuhiro Hattori (AutoNet Tech.), Terutaka Tamai (Mie Univ.) R2009-57 EMD2009-124 |
Tin plated surface used for contact surface such as connectors is usually covered with the oxide vfilm in the atmosphere... [more] | R2009-57 EMD2009-124 pp.43-48 |
|
[Return to Top Page]