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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM |
2019-10-24 13:00 |
Miyagi |
Niche, Tohoku Univ. |
[Invited Talk]
Random nanostructure formation and electric readout for nano-artifact metrics Seiya Kasai, Renpeng Lu, Katsumi Shimizu, Xiang Yin (Hokkaido Univ.), Yosuke Ueba, Mikio Ishikawa, Mitsuru Kitamura (DNP), Morihisa Hoga (AIST), Makoto Naruse (Univ. of Tokyo), Tsutomu Matsumoto (YNU) SDM2019-62 |
We introduce a basic concept of nano-artifact metrics, expected to be a highly secure authentication technique using nan... [more] |
SDM2019-62 pp.45-50 |
SDM, ED, CPM |
2019-05-17 11:10 |
Shizuoka |
Shizuoka Univ. (Hamamatsu) |
Experimental Study on Optimization of 2D Random Nanostructure Formation and Electrical Readout for Nano Artifact Metrics Renpeng Lu, Katsumi Shimizu, Xiang Yin (Hokkaido Univ.), Yosuke Ueba, Mikio Ishikawa, Mitsuru Kitamura (DNP), Seiya Kasai (Hokkaido Univ.) ED2019-24 CPM2019-15 SDM2019-22 |
For nano-artifact metrics utilizing resist collapse in nanometer-scale electron beam lithography, we investigate lithogr... [more] |
ED2019-24 CPM2019-15 SDM2019-22 pp.67-70 |
HWS |
2018-04-13 11:35 |
Fukuoka |
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Optical 3D Nano Artifact-metrics using White Light Interferometry Naoki Yoshida (YNU), Yosuke Ueba, Shumpei Nishio, Yasuyuki Ohyagi (DNP), Morihisa Hoga (Compass21), Naoya Tate (KU), Makoto Naruse (NICT), Tsutomu Matsumoto (YNU) HWS2018-3 |
We propose an artificial-metric system which authenticates nanostructures with random irregularities by means of an inte... [more] |
HWS2018-3 pp.11-16 |
PN, EMT, LQE, OPE, MWP, EST, IEE-EMT [detail] |
2013-01-25 12:45 |
Osaka |
Osaka Univ. (Suita) |
Spectral Control of Thermal Radiation by Split-Ring Resonator Yosuke Ueba (Osaka Univ.), Junichi Takahara (Osaka Univ./PARC) PN2012-57 OPE2012-166 LQE2012-158 EST2012-93 MWP2012-75 |
[more] |
PN2012-57 OPE2012-166 LQE2012-158 EST2012-93 MWP2012-75 pp.197-200 |
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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