Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ, MW, EST, IEE-EMC [detail] |
2022-10-13 09:55 |
Akita |
Akita University (Primary: On-site, Secondary: Online) |
Fundamental Study on Leakage Source Model for Electromagnetic Information Leakage from Video Display Units Taiki Kitazawa (NAIST), Hiroyuki Kubo (Chiba Univ.), Yuichi Hayashi (NAIST) EMCJ2022-37 MW2022-83 EST2022-47 |
In the case of applying zoning countermeasures against the threat of information leakage using electromagnetic (EM) wave... [more] |
EMCJ2022-37 MW2022-83 EST2022-47 pp.11-15 |
EMCJ, MW, EST, IEE-EMC [detail] |
2022-10-14 09:50 |
Akita |
Akita University (Primary: On-site, Secondary: Online) |
Development of an Evaluation System for Modeling of Information Leakage Induced by Low-Power IEMI Seiya Takano, Shugo Kaji (NAIST), Masahiro Kinugawa (Univ. of Fukuchiyama), Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2022-53 MW2022-99 EST2022-63 |
The threats of electromagnetic (EM) information leakage induced by low-power intentional EM interference have been repor... [more] |
EMCJ2022-53 MW2022-99 EST2022-63 pp.93-96 |
EMM, BioX, ISEC, SITE, ICSS, HWS, IPSJ-CSEC, IPSJ-SPT [detail] |
2022-07-19 13:50 |
Online |
Online |
Randomness evaluation of TERO-based TRNG with a side-channel attack countermeasure Saki Osuka (AIST), Daisuke Fujimoto, Yuichi Hayashi (NAIST), Shinichi Kawamura (AIST) ISEC2022-9 SITE2022-13 BioX2022-34 HWS2022-9 ICSS2022-17 EMM2022-17 |
True random number generators (TRNGs) based on ring oscillators (ROs) are employed in many devices because they can be c... [more] |
ISEC2022-9 SITE2022-13 BioX2022-34 HWS2022-9 ICSS2022-17 EMM2022-17 pp.13-17 |
EMCJ |
2022-06-10 11:25 |
Hokkaido |
Hokkaido University (Primary: On-site, Secondary: Online) |
High-speed Channel Design based on Statistical and Analytical Approach Youngwoo Kim, Yuichi Hayashi (NAIST) EMCJ2022-19 |
[more] |
EMCJ2022-19 pp.26-29 |
EMCJ |
2022-06-10 16:50 |
Hokkaido |
Hokkaido University (Primary: On-site, Secondary: Online) |
Fundamental Study of Electromagnetic Information Leakage Suppression at Printed Circuit Board Power Delivery Network in Cryptographic Devices Shinpei Wada, Daisuke Fujimoto, Yuichi Hayashi, Youngwoo Kim (NAIST) EMCJ2022-27 |
[more] |
EMCJ2022-27 pp.63-67 |
HWS |
2022-04-26 13:30 |
Tokyo |
AIST Tokyo Waterfront (Annex) (Primary: On-site, Secondary: Online) |
Fundamental Study on ID Generation Method Focusing on Distribution of Capacitance Sensor Output Values Shugo Kaji, Ayaki Tachikake, Daisuke Fujimoto, Yuichi Hayashi (NAIST) HWS2022-4 |
An individual identification using a capacitance sensor configured with a constant current source and an A/D converter i... [more] |
HWS2022-4 pp.19-23 |
EMCJ |
2022-04-15 14:45 |
Okinawa |
(Primary: On-site, Secondary: Online) |
Analysis of Crosstalk Suppression by Low-Impedance PDN Using Ultra-Thin and High Dielectric Permittivity Substrates Taiki Kitazawa, Youngwoo Kim, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2022-5 |
The high impedance power delivery network (PDN) induced crosstalk is caused by the return current discontinuity of signa... [more] |
EMCJ2022-5 pp.25-30 |
VLD, HWS [detail] |
2022-03-08 15:45 |
Online |
Online |
Evaluation Method for EM Information Leakage from Speakerphone Using Voice Frequency Spectrum Analysis Hiroyuki Ueda, Seiya Takano, Daisuke Fujimoto, Yuichi Hayashi (NAIST) VLD2021-102 HWS2021-79 |
The usage environment for speakerphones becomes more diverse with remote work. As a result, the surrounding environment ... [more] |
VLD2021-102 HWS2021-79 pp.147-152 |
VLD, HWS [detail] |
2022-03-08 16:10 |
Online |
Online |
Fundamental Evaluation Method for EM Information Leakage Caused by Hardware Trojans on Signal Cables
-- Impact of Modulation Factor and Emission Intensity -- Taiga Yukawa, Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST) VLD2021-103 HWS2021-80 |
The threats of electromagnetic (EM) information leakage caused by hardware Trojans (HTs) implemented on signal cables ha... [more] |
VLD2021-103 HWS2021-80 pp.153-157 |
VLD, HWS [detail] |
2022-03-08 17:15 |
Online |
Online |
Development of a Test Environment for Attack-Resistance Evaluation of Matrix Direct ToF Lidar Masato Suzuki, Daisuke Fujimoto, Yuichi Hayashi (NAIST) VLD2021-105 HWS2021-82 |
Matrix-type Direct Time of flight (dToF) Lidar, which enables high-resolution and high-speed acquisition of distance inf... [more] |
VLD2021-105 HWS2021-82 pp.164-169 |
HWS, ICD [detail] |
2021-10-19 10:50 |
Online |
Online |
Study on Fault Injection into Cryptographic Modules Using Continuous Sinusoidal Waves with Controlled Frequency, Amplitude and Phase Hikaru Nishiyama, Daisuke Fujimoto, Youngwoo Kim, Yuichi Hayashi (NAIST) HWS2021-43 ICD2021-17 |
A fault injection attack based on an intentional electromagnetic interference (IEMI) using a continuous sinusoidal wave ... [more] |
HWS2021-43 ICD2021-17 pp.13-18 |
BioX, ISEC, SITE, ICSS, EMM, HWS, IPSJ-CSEC, IPSJ-SPT [detail] |
2021-07-19 13:30 |
Online |
Online |
Fundamental Study on Acceleration of Inversion using Binary Extended Euclidean Algorithm for Pairing Computation in RNS Representation Kota Morimoto, Daisuke Fujimoto, Saki Osuka (NAIST), Shinichi Kawamura, Tadanori Teruya (AIST), Yuichi hayashi (NAIST) ISEC2021-10 SITE2021-4 BioX2021-11 HWS2021-10 ICSS2021-15 EMM2021-15 |
Pairing computation is an essential tool in advanced cryptography, and Yao et al. have shown that a hardware implementat... [more] |
ISEC2021-10 SITE2021-4 BioX2021-11 HWS2021-10 ICSS2021-15 EMM2021-15 pp.1-7 |
EMCJ |
2021-07-01 13:05 |
Online |
Online |
An Investigation on Effect of Anisotropy of FR-4 Substrates to Signal Transmission Using FDTD Analysis Taiki Kitazawa (NAIST), Taiki Yamagiwa, Ren Kitahara (UEC), Jerdvisanop Chakarothai (NICT), Takashi Kasuga (NIT, Nagano College), Yuichi Hayashi (NAIST) EMCJ2021-17 |
Recently, FR-4 substrates are widely used in PCB. FR-4 substrates are composed of glass fiber and epoxy resin, and there... [more] |
EMCJ2021-17 pp.1-6 |
EMCJ |
2021-07-01 15:50 |
Online |
Online |
Study on Estimation of Increment of the Current Noise using Equivalent Model for Power Line with Multiple LED Bulbs Seiya Takano (NAIST), Ryoya Hirabayashi, Shuhei Hotta, Takashi Kasuga (NIT,Nagano College), Yuichi Hayashi (NAIST), Hiroshi Inoue (Akita Univ.) EMCJ2021-23 |
It is known that the electromagnetic noise propagate on the power line with multiple LED bulbs are increases based on th... [more] |
EMCJ2021-23 pp.34-39 |
HWS |
2021-04-12 15:05 |
Tokyo |
Tokyo University/Online (Primary: On-site, Secondary: Online) |
Fundamental Study on Evaluating Frequency Injection Attack Resistance against RO-based TRNGs Riki Hashimoto, Daisuke Fujimoto, Yuichi Hayashi (NAIST) HWS2021-9 |
Frequency injection attacks have been reported as an attack to degrade the randomness of ring oscillator (RO)-based true... [more] |
HWS2021-9 pp.39-42 |
EMD |
2021-03-08 16:15 |
Online |
Online |
Fundamental Study on Effect of Surface Roughness of Contact Boundary and Torque Value on High-Frequency Characteristics of Connectors Hiroyuki Ueda, Shugo Kaji, Daisuke Fujimoto, Youngwoo Kim, Yuichi Hayashi (NAIST) EMD2020-37 |
Wear occurs on the contact surface due to sliding and vibration of the connector. This increases the contact resistance,... [more] |
EMD2020-37 pp.40-43 |
HWS, VLD [detail] |
2021-03-04 16:50 |
Online |
Online |
Screen Information Reconstruction from High Resolution Displays Focusing on Multiple Leakage Frequencies Kimihiro Arai, Daisuke Fujimoto, Yuichi Hayashi (NAIST) VLD2020-90 HWS2020-65 |
[more] |
VLD2020-90 HWS2020-65 pp.126-129 |
HWS, VLD [detail] |
2021-03-04 17:15 |
Online |
Online |
Fundamental Study on Evaluation of EM Information Leakage from Smart Speakers with Different Installation Environments and Its Countermeasures Shogo Fukushima, Daisuke Fujimoto, Yuichi Hayashi (NAIST) VLD2020-91 HWS2020-66 |
Conventional studies on EM information leakage have mainly focused on only individual information devices. On the other ... [more] |
VLD2020-91 HWS2020-66 pp.130-135 |
EMD |
2020-12-04 15:50 |
Online |
Online |
Fundamental Evaluation of Impedance Variations in the Connector Caused by High-Frequency Noise Propagation Hiroyuki Ueda, Shugo Kaji, Youngwoo Kim, Daisuke Fujimoto (NAIST), Taiki Kitazawa, Takashi Kasuga (NIT,Nagano College)), Yuichi Hayashi (NAIST) EMD2020-24 |
As the operating frequency of information devices increases, the noise generated by the device is also becoming broadban... [more] |
EMD2020-24 pp.34-38 |
ICD, HWS [detail] |
2020-10-26 09:50 |
Online |
Online |
Fundamental Evaluation Method of EM Information Leakage Caused by Intentional Electromagnetic Interference
-- Impact of Impedance Change in Digital Output Circuits -- Shugo Kaji, Daisuke Fujimoto (NAIST), Masahiro Kinugawa (Univ. of Fukuchiyama), Yuichi Hayashi (NAIST) HWS2020-27 ICD2020-16 |
New threats have been shown to cause information leakage by irradiating electromagnetic (EM) waves of specific intensity... [more] |
HWS2020-27 ICD2020-16 pp.13-17 |