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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2020-11-17 11:20 |
Online |
Online |
Control Point Selection Approach for Scan Pattern Reduction under Multi-cycle Test Hikaru Tamaki, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34 |
[more] |
VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34 pp.24-29 |
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