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Committee Date Time Place Paper Title / Authors Abstract Paper #
IE 2010-03-15
13:00		 Miyagi RIEC Bldg. #2, 4gh Floor, Tohoku Univ. Improving the Performance of SIFT Using Bilateral Filter
Tomoaki Yamazaki, Jiro Katto (Waseda Univ.) IE2009-184		 One of the typical methods to extract the features of images is SIFT. SIFT has advantages of robustness in rotation, sca... [more] IE2009-184
pp.29-34
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