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All Technical Committee Conferences (Searched in: Recent 10 Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SIS, IPSJ-AVM |
2022-06-09 15:00 |
Fukuoka |
KIT(Wakamatsu Campus) (Fukuoka, Online) (Primary: On-site, Secondary: Online) |
[Invited Talk]
Advanced applications of machine learning techniques towards high-performance and cost-effective visual inspection AI Terumasa Tokunaga (Kyutech) SIS2022-6 |
Visual inspection is an essential step for quality control in manufacturing. Recently, many researchers have shown great... [more] |
SIS2022-6 p.30 |
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