|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SS |
2018-03-07 15:00 |
Okinawa |
|
Suggestion of Test Case Generation Method with Priority Based on Use Case of User for System Test Emi Saito, Ai Toshikuni, Yuichiroh Nakagawa (Hitachi) SS2017-76 |
In embedded systems, developers have a demand to find serious defects early. We suppose that it is serious as defects to... [more] |
SS2017-76 pp.69-74 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|