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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, ICD, ITE-IST [detail] 2018-08-07
11:30		 Hokkaido Hokkaido Univ., Graduate School of IST M Bldg., M151 Comparison of Sensitivity to Soft Errors of NMOS and PMOS Transistors by Using Three Types of Stacking Latches in an FDSOI process
Kodai Yamada, Jun Furuta, Kazutoshi Kobayashi (KIT) SDM2018-28 ICD2018-15		 (To be available after the conference date) [more] SDM2018-28 ICD2018-15
pp.15-20
R 2015-11-19
14:25		 Osaka   A Measurement Method for the Extent of Simultaneous Soft Errors
Noboru Masuda, Moritoshi Yasunaga (Univ. of Tsukuba) R2015-57		 Regarding the LSI soft error caused by the neutron beam, a single particle of neutron may cause multiple chained soft er... [more] R2015-57
pp.5-10
ICD 2012-12-18
11:45		 Tokyo Tokyo Tech Front A 65 nm Low-Power Adaptive-Coupling Redundant Flip-Flop
Masaki Masuda, Kanto Kubota, Ryosuke Yamamoto (KIT), Jun Furuta (Kyoto Univ.), Kazutoshi Kobayashi (KIT), Hidetoshi Onodera (Kyoto Univ.) ICD2012-117		 We propose a low-power redundant flip-flop to be operated with high reliability over 1 GHz clock frequency based on the ... [more] ICD2012-117
pp.109-113
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2009-12-02
13:50		 Kochi Kochi City Culture-Plaza [Invited Talk] Failures due to Terrestriall Neutrons in Most Advanced Semicondutor Devices -- Impacts and Hardening Techniques down to 22nm Design Rule --
Eishi Ibe, Kenichi Shimbo, Hitoshi Taniguchi, Tadanobu Toba (Hitachi, Ltd.) CPM2009-139 ICD2009-68		 The status-of-the-art in failures and their mechanisms of CMOS memories and logic gates induced by terrestrial neutrons ... [more] CPM2009-139 ICD2009-68
pp.29-34
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